參數(shù)資料
型號: KAI-2001-AAA-CF-BA
廠商: KODAK IMAGE SENSOR SOLUTIONS
元件分類: CCD Image Sensor
英文描述: IMAGE SENSOR-CCD, 1600(H) X 1200(V) PIXEL, RECTANGULAR, THROUGH HOLE MOUNT
封裝: CERAMIC, DIP-32
文件頁數(shù): 15/48頁
文件大?。?/td> 2270K
代理商: KAI-2001-AAA-CF-BA
4. Global Peak to Peak Non-Uniformity
This test is performed with the imager illuminated to a level such that the output is at 80% of saturation (approximately
32,000 electrons). Prior to this test being performed the substrate voltage has been set such that the charge capacity
of the sensor is 40,000 electrons. The sensor is partitioned into 192 sub regions of interest, each of which is 100 by
100 pixels in size. See Figure 15: Test Sub Regions of Interest. The average signal level of each of the 192 sub
regions of interest (ROI) is calculated. The signal level of each of the sub regions of interest is calculated using the
following formula:
Signal of ROI[i] = (ROI Average in ADU – Horizontal overclock average in ADU) * mV per count
Where i = 1 to 192. During this calculation on the 192 sub regions of interest, the maximum and minimum signal levels are found.
The global peak to peak uniformity is then calculated as:
Signal
Area
Active
Signal
Minimum
-
Signal
Maximum
Uniformity
Global
=
Units: %pp
5. Center Non-Uniformity
This test is performed with the imager illuminated to a level such that the output is at 80% of saturation (approximately
32,000 electrons). Prior to this test being performed the substrate voltage has been set such that the charge capacity
of the sensor is 40,000 electrons. Defects are excluded for the calculation of this test. This test is performed on the
center 100 by 100 pixels (See Figure 15: Test Sub Regions of Interest) of the sensor. Center uniformity is defined as:
=
Signal
ROI
Center
Deviation
Standard
ROI
Center
*
100
Uniformity
ROI
Center
Units: %rms
6. Dark field defect test
This test is performed under dark field conditions. The sensor is partitioned into 192 sub regions of interest, each of
which is 100 by 100 pixels in size. See Figure 15: Test Sub Regions of Interest. In each region of interest, the median
value of all pixels is found. For each region of interest, a pixel is marked defective if it is greater than or equal to the
median value of that region of interest plus the defect threshold specified in “Defect Definitions” section.
Eastman Kodak Company, 2006
www.kodak.com/go/imagers
Revision 2.0 MTD/PS-0609 p22
相關(guān)PDF資料
PDF描述
KAS1104E SLIDE DIP SWITCH-4SWITCHES, SPST, LATCHED,THROUGH HOLE-STRAIGHT
KBL06 4 A, 600 V, SILICON, BRIDGE RECTIFIER DIODE
KBP04G 1.5 A, 400 V, SILICON, BRIDGE RECTIFIER DIODE
KBPC2508IP 25 A, 800 V, SILICON, BRIDGE RECTIFIER DIODE
KBPC602 6 A, 200 V, SILICON, BRIDGE RECTIFIER DIODE
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