參數(shù)資料
型號(hào): KAI-1020-ABB-JB-AE
廠商: KODAK IMAGE SENSOR SOLUTIONS
元件分類: CCD Image Sensor
英文描述: IMAGE SENSOR-CCD, 1000(H) X 1000(V) PIXEL, 500mV, SQUARE, THROUGH HOLE MOUNT
封裝: PGA-68
文件頁數(shù): 13/72頁
文件大?。?/td> 3212K
代理商: KAI-1020-ABB-JB-AE
7. Bright field defect test
This test is performed with the light source illuminated to a level such that the output of the sensor is at 70% of
saturation (approximately 364 mV). Prior to this test being performed the substrate voltage has been set such that
the charge capacity of the sensor is 520mV. The average signal level of all active pixels is found. The bright and dark
thresholds are set as:
Dark defect threshold
= Active Area Signal * threshold
Bright defect threshold = Active Area Signal * threshold
sub regions of interest, each of which is 100 by 100 pixels in size. See Figure
. In each region of interest, the average value of all pixels is found. For each region of
ian of this region of interest is found to be 366 mV.
Any pixel in this region of interest that is >= (366+40mV) 406mV in intensity will be marked defective.
(366-40mV) 324mV in intensity will be marked defective.
All remaining 99 sub regions of interest are analyzed for
in the same manner.
r defect test
al * threshold
The sensor is then partitioned into 2500 sub regions of interest, each of which is 20
2
e. In each
region of interest, the average value of all pixels is found. For each region of interest, a pixel is marked defective if it
is less than or equ
specified.
Example for bright field minor defective pixels:
value of all active pixels is found to be 365 mV.
mV in intensity will be marked defective.
All remaining 2499 sub regions of interest are analyzed for defective pixels in the same manner.
9. Bright field column average magnitude test
This test is performed with the light source illuminated to a level such that the output of the sensor is at 70% of
saturation (approximately 364 mV). Prior to this test being performed the substrate voltage has been set such that
the charge capacity of the sensor is 520mV. A column is marked as defective if
The sensor is then partitioned into 100
1: Test Sub Regions of Interest
365mV * 11% = 40mV
Bright defect threshold:
365mV * 11% = 40mV
Region of interest #1 selected. This region of interest is pixels 1,1 to pixels 100,100.
o
Med
o
Any pixel in this region of interest that is <=
defective pixels
8. Bright field mino
This test is performed with the light source illuminated to a level such that the output of the sensor is at 70% of
saturation (approximately 364 mV). Prior to this test being performed the substrate voltage has been set such that
the charge capacity of the sensor is 520mV. The average signal level of all active pixels is found. The dark thresholds
is set as:
Dark defect threshold
= Active Area Sign
by 0 pixels in siz
al to the median value of that region of interest minus the dark threshold
Average
Dark defect threshold: 365mV * 5% = 18mV
Region of interest #1 selected. This region of interest is pixels 1,1 to pixels 20,20.
o
Median of this region of interest is found to be 366 mV.
o
Any pixel in this region of interest that is <= (366-18mV) 348
4
.
0
*
100
>
x)
lumn
Avg(Avg(Co
x)
lumn
Avg(Avg(Co
-
n)
Avg(Column
abs
where x=n-2 to n+2
Eastman Kodak Company, 2007
www.kodak.com/go/imagers
Revision 5.0 MTD/PS-0205 p20
相關(guān)PDF資料
PDF描述
KAI-16000-AAA-JD-AE IMAGE SENSOR-CCD, 4872(H) X 3248(V) PIXEL, RECTANGULAR, THROUGH HOLE MOUNT
KAI-2001-AAA-CF-BA IMAGE SENSOR-CCD, 1600(H) X 1200(V) PIXEL, RECTANGULAR, THROUGH HOLE MOUNT
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