參數(shù)資料
型號: K6R3024V1D-HC10
廠商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: 128K x 24 Bit High-Speed CMOS Static RAM(3.3V Operating)
中文描述: 128K的× 24位高速CMOS靜態(tài)RAM(3.3V的工作)
文件頁數(shù): 8/9頁
文件大小: 172K
代理商: K6R3024V1D-HC10
K6R3024V1D
CMOS SRAM
Revision 1.0
December 2001
- 8 -
for AT&T
NOTES
(WRITE CYCLE)
1. All write cycle timing is referenced from the last valid address to the first transition address.
2. A write occurs during the overlap of a low CS and WE. A write begins at the latest transition CS going low and WE going low ;
A write ends at the earliest transition CS going high or WE going high. t
WP
is measured from the beginning of write to the end of
write.
3. t
CW
is measured from the later of CS going low to end of write.
4. t
AS
is measured from the address valid to the beginning of write.
5. t
WR
is measured from the end of write to the address change. t
WR
applied in case a write ends as CS or WE going high.
6. If OE, CS and WE are in the Read Mode during this period, the I/O pins are in the output low-Z state. Inputs of opposite phase
of the output must not be applied because bus contention can occur.
7. For common I/O applications, minimization or elimination of bus contention conditions is necessary during read and write cycle.
8. If CS goes low simultaneously with WE going or after WE going low, the outputs remain high impedance state.
9. Dout is the read data of the new address.
10. When CS is low : I/O pins are in the output state. The input signals in the opposite phase leading to the output should not be
applied.
11. CS represents CS
1
, CS
2
and CS
3
in this data sheet. CS
2
as of opposite polarity to CS
1
and CS
3.
TIMING WAVEFORM OF WRITE CYCLE(3)
(CS
=
Controlled)
Address
CS
t
AW
t
DW
t
DH
Data Valid
WE
Data in
Data out
High-Z
High-Z(8)
t
CW(3)
t
WP(2)
t
AS(4)
t
WC
t
WR(5)
High-Z
High-Z
t
LZ
t
WHZ(6)
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