參數(shù)資料
型號(hào): IVC102
元件分類(lèi): 跨阻放大器
英文描述: PRECISION SWITCHED INTEGRATOR TRANSIMPEDANCE AMPLIFIER
中文描述: 精密投切積分器互阻抗放大器
文件頁(yè)數(shù): 8/10頁(yè)
文件大小: 124K
代理商: IVC102
8
IVC102
The input current, I
IN
, is shown as a conventional current
flowing into pin 2 in this diagram but the input current could
be bipolar (positive or negative). Current flowing out of pin
2 would produce a positive-ramping V
O
.
The timing sequence proceeds as follows:
Reset Period
The integrator is reset by closing switch S
2
with S
1
open. A
10
μ
s reset time is recommended to allow the op amp to slew
to 0V and settle to its final value.
Pre-Integration Hold
S
2
is opened, holding V
O
constant for 10
μ
s prior to integra-
tion. This pre-integration hold period assures that S
2
is fully
open before S
1
is closed so that no input signal is lost. A
minimum of 1
μ
s is recommended to avoid switching over-
lap. The 10
μ
s hold period shown in Figure 3b also allows an
a/d converter measurement to be made at point A. The
purpose of this measurement at A is discussed in the “Offset
Errors” section.
Integration on C
INT
Integration of the input current on C
INT
begins when S
1
is
closed. An immediate step output voltage change occurs as
the charge that was stored on the input sensor capacitance is
transferred to C
INT
. Although this period of charging C
INT
occurs only while S
1
is closed, the charge transferred as S
1
is closed causes the
effective
integration time to be equal to
the complete conversion period—see Figure 3b.
The integration period could range from 100
μ
s to many
minutes, depending on the input current and C
INT
value.
While S
1
is closed, I
IN
charges C
INT
, producing a negative-
going ramp at the integrator output voltage, V
O
. The output
voltage at the end of integration is proportional to the
average input current throughout the complete conversion
cycle, including the integration period, reset and both hold
periods.
Hold Period
Opening S
1
halts integration on C
INT
. Approximately 5
μ
s
after S
1
is opened, the output voltage is stable and can be
measured (at point B). The hold period is 10
μ
s in this
example. C
INT
remains charged until a S
2
is again closed, to
reset for the next conversion cycle.
In this timing example, S
1
is open for a total of 30
μ
s. During
this time, signal current from the sensor charges the sensor
source capacitance. Care should be used to assure that the
voltage developed on the sensor does not exceed approxi-
mately 200mV during this time. The I
IN
terminal, pin 2, is
internally clamped with diodes. If these diodes forward bias,
signal current will flow to ground and will not be accurately
integrated.
A maximum of 333nA signal current could be accurately
integrated on a 50pF sensor capacitance for 30
μ
s before
200mV would be developed on the sensor.
I
MAX
= (50pF) (200mV)/30
μ
s = 333nA
OFFSET ERRORS
Figure 3c shows the effect on V
O
due to op amp input offset
voltage, input bias current and switch charge injection. It
assumes zero input current from the sensor. The various
offsets and charge injection (
Q) jumps shown are typical of
that seen with a 50pF source capacitance. The specified
“transfer function offset voltage” is the voltage measured
during the hold period at B. Transfer function offset voltage
is dominated by the charge injection of S
2
opening and op
amp V
OS
. The opening and closing charge injections of S
1
are very nearly equal and opposite and are not significant
contributors.
Note that using a two-point difference measurement at A
and B can dramatically reduce offset due to op amp V
OS
and
S
2
charge injection. The remaining offset with this B-A
measurement is due to op amp input bias current charging
C
INT
. This error is usually very small and is exaggerated in
the figure.
DIGITAL SWITCH INPUTS
The digital control inputs to S
1
and S
2
are compatible with
standard CMOS or TTL logic. Logic input pins 11 and 12
are high impedance and the threshold is approximately 1.4V
relative to Digital Ground, pin 13. A logic “l(fā)ow” closes the
switch.
Use care in routing these logic signals to their respective
input pins. Capacitive coupling of logic transitions to sensi-
tive input nodes (pins 2 through 6) and to the positive power
supply (pin 14) will dramatically increase charge injection
and produce errors. Route these circuit board traces over a
ground plane (digital ground) and route digital ground traces
between logic traces and other critical traces for lowest
charge injection. See Figure 4.
5V logic levels are generally satisfactory. Lower voltage
logic levels may help reduce charge injection errors, de-
pending on circuit layout. Logic high voltages greater than
5.5V, or higher than the V+ supply are not recommended.
FIGURE 4. Circuit Board Layout Techniques.
Input trace guarded
all the way to sensor.
Switch logic inputs
guarded by digital
ground.
Analog
Ground
Digital
Ground
Pins 7 and 8 have no internal
connection but are connected to
ground for lowest noise pickup.
V+
Input nodes
guarded by
analog ground.
V–
V
O
S
1
S
2
14
8
7
1
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