11 FN6209.3 July 25, 2012 Figure 28A illustrates the optimum output load for testing AC performance. Figure 28B illustrates the optimu" />
參數(shù)資料
型號: ISL59482IRZ
廠商: Intersil
文件頁數(shù): 3/15頁
文件大小: 0K
描述: IC MUX AMP DUAL 500MHZ 48-QFN
標(biāo)準(zhǔn)包裝: 43
應(yīng)用: 4:1 多路復(fù)用器-放大器
電路數(shù): 3
-3db帶寬: 520MHz
轉(zhuǎn)換速率: 1600 V/µs
電流 - 電源: 88mA
電流 - 輸出 / 通道: 180mA
安裝類型: 表面貼裝
封裝/外殼: 48-VFQFN 裸露焊盤
供應(yīng)商設(shè)備封裝: 48-QFN-EP(7x7)
包裝: 管件
產(chǎn)品目錄頁面: 1235 (CN2011-ZH PDF)
ISL59482
11
FN6209.3
July 25, 2012
Figure 28A illustrates the optimum output load for testing AC
performance. Figure 28B illustrates the optimum output load
when connecting to 50
Ω input terminated equipment.
Application Information
General
The ISL59482 is ideal as the matrix element of high
performance switchers and routers. Key features include internal
fixed gain of 2, high impedance buffered analog inputs and
excellent AC performance at output loads down to 150
Ω for
video cable-driving. The current feedback output amplifiers are
stable operating into capacitive loads.
Ground Connections
For the best isolation and crosstalk rejection, all GND pins must
connect to the GND plane.
Power-up Considerations
The ESD protection circuits use internal diodes from all pins the V+
and V- supplies. In addition, a dV/dT- triggered clamp is connected
between the V+ and V- pins, as shown in the Equivalent Circuits 1
through 4 section of the “Pin Description” on page 3. The dV/dT
triggered clamp imposes a maximum supply turn-on slew rate of
1V/s. Damaging currents can flow for power supply rates-of-rise in
excess of 1V/s, such as during hot plugging. Under these
conditions, additional methods should be employed to ensure the
rate of rise is not exceeded.
Consideration must be given to the order in which power is
applied to the V+ and V- pins, as well as analog and logic input
pins. Schottky diodes (Motorola MBR0550T or equivalent)
connected from V+ to ground and V- to ground (Figure 29) will
shunt damaging currents away from the internal V+ and V- ESD
diodes in the event that the V+ supply is applied to the device
before the V- supply. One Schottky can be used to protect both V+
power supply pins, and a second for the protection of both V-
pins.
If positive voltages are applied to the logic or analog video input
pins before V+ is applied, current will flow through the internal
ESD diodes to the V+ pin. The presence of large decoupling
capacitors and the loading effect of other circuits connected to
V+, can result in damaging currents through the ESD diodes and
other active circuits within the device. Therefore, adequate
current limiting on the digital and analog inputs is needed to
prevent damage during the time the voltages on these inputs are
more positive than V+.
HIZ State
Each internal 4:1 triple MUX-amp has a three-state output control
pin (HIZ1 and HIZ2). Each has a an internal pull-down resistor to
set the output to the enabled state with no connection to the HIZ
pin. The HIZ state is established within approximately 20ns by
placing a logic high (>2V) on the HIZ pin. If the HIZ state is
selected, the output is a high impedance 1.4M
Ω with
approximately 1.5pF in parallel with a 10
μA bias current from
the output. When more than one MUX shares a common output,
the high impedance state loading effect is minimized over the
maximum output voltage swing and maintains its high Z even in
the presence of high slew rates. The supply current during this
state is the same as the active state.
EN and Power-down States
The EN pin is active low. An internal pull-down resistor ensures
the device will be active with no connection to the EN pin. The
Power-down state is established within approximately 80ns, if a
logic high (>2V) is placed on the EN pin. In the Power-down state,
supply current is reduced significantly by shutting the three
amplifiers off. The output presents a high impedance to the
output pin, however, there is a risk that the disabled amplifier
output can be back-driven at signal voltage levels exceeding
2VP-P. Under this condition, large incoming slew rates can cause
fault currents of tens of mA. Therefore, the parallel connection of
multiple outputs is not recommended unless the application can
tolerate the limited power-down output impedance.
Limiting the Output Current
No output short circuit current limit exists on these parts. All
applications need to limit the output current to less than 50mA.
Adequate thermal heat sinking of the parts is also required.
FIGURE 28C. BACKLOADED TEST CIRCUIT FOR VIDEO CABLE APPLICATION. BANDWIDTH AND LINEARITY FOR RL LESS THAN 500Ω WILL BE
DEGRADED.
FIGURE 28. TEST CIRCUITS
AC Test Circuits (Continued)
ISL59482
RS
CL
VIN
50
Ω or 75Ω
TEST
5pF
50
Ω
or
75
Ω
50
Ω
or
75
Ω
EQUIPMENT
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