4
INDUSTRIALTEMPERATURERANGE
IDT74FCT162827AT/CT
FAST CMOS 20-BIT BUFFER
Symbol
Parameter
Test Conditions(1)
Min.
Typ.(2)
Max.
Unit
ΔICC
Quiescent Power Supply Current
VCC = Max.
—
0.5
1.5
mA
TTL Inputs HIGH
VIN = 3.4V(3)
ICCD
Dynamic Power Supply Current(4)
VCC = Max.
VIN = VCC
—
60
100
A/
OutputsOpen
VIN = GND
MHz
x
OE1 = xOE2 = GND
OneInputToggling
50% Duty Cycle
IC
Total Power Supply Current(6)
VCC = Max.
VIN = VCC
—
0.6
1.5
mA
OutputsOpen
VIN = GND
fi = 10MHz
50% Duty Cycle
VIN = 3.4V
—
0.9
2.3
x
OE1 = xOE2 = GND
VIN = GND
One Bit Toggling
VCC = Max.
VIN = VCC
—
3
5.5(5)
OutputsOpen
VIN = GND
fi = 2.5MHz
50% Duty Cycle
VIN = 3.4V
—
8
20.5(5)
x
OE1 = xOE2 = GND
VIN = GND
Twenty Bits Toggling
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested.
6. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC +
ΔICC DHNT + ICCD (fCPNCP/2 + fiNi)
ICC = Quiescent Current (ICCL, ICCH and ICCZ)
ΔICC = Power Supply Current for a TTL High Input (VIN = 3.4V)
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
NCP = Number of Clock Inputs at fCP
fi = Input Frequency
Ni = Number of Inputs at fi
POWER SUPPLY CHARACTERISTICS