3
IDT74FCT162827AT/CT
FAST CMOS 20-BIT BUFFER
INDUSTRIALTEMPERATURERANGE
Symbol
Parameter
Test Conditions(1)
Min.
Typ.(2)
Max.
Unit
VIH
Input HIGH Level
Guaranteed Logic HIGH Level
2
—
V
VIL
Input LOW Level
Guaranteed Logic LOW Level
—
0.8
V
IIH
Input HIGH Current (Input pins)(4)
VCC = Max.
VI = VCC
——
±1
A
Input HIGH Current (I/O pins)(4)
——
±1
IIL
Input LOW Current (Input pins)(4)
VI = GND
—
±1
Input LOW Current (I/O pins)(4)
——
±1
IOZH
High Impedance Output Current
VCC = Max.
VO = 2.7V
—
±1
A
IOZL
(3-StateOutputpins)(4)
VO = 0.5V
—
±1
VIK
Clamp Diode Voltage
VCC = Min., IIN = –18mA
—
–0.7
–1.2
V
IOS
Short Circuit Current
VCC = Max., VO = GND(3)
–80
–140
–250
mA
VH
Input Hysteresis
—
100
—
mV
ICCL
Quiescent Power Supply Current
VCC = Max
—
5
500
A
ICCH
VIN = GND or VCC
ICCZ
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: TA = –40°C to +85°C, VCC = 5.0V ±10%
Symbol
Parameter
Test Conditions(1)
Min.
Typ.(2)
Max.
Unit
IODL
Output LOW Current
VCC = 5V, VIN = VIH or VIL, VO = 1.5V(3)
60
115
200
mA
IODH
Output HIGH Current
VCC = 5V, VIN = VIH or VIL, VO = 1.5V(3)
–60
–115
–200
mA
VOH
Output HIGH Voltage
VCC = Min.
IOH = –24mA
2.4
3.3
—
V
VIN = VIH or VIL
VOL
Output LOW Voltage
VCC = Min.
IOL = 24mA
—
0.3
0.55
V
VIN = VIH or VIL
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
4. This test limit for this parameter is ±5A at TA = –55°C.
OUTPUT DRIVE CHARACTERISTICS