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參數(shù)資料
| 型號： | IDT6116LA55TDB |
| 廠商： | INTEGRATED DEVICE TECHNOLOGY INC |
| 元件分類： | DRAM |
| 英文描述： | CMOS STATIC RAM 16K (2K x 8 BIT) |
| 中文描述： | 2K X 8 STANDARD SRAM, 55 ns, CDIP24 |
| 封裝： | 0.300 INCH, CERAMIC, DIP-24 |
| 文件頁數(shù)： | 9/10頁 |
| 文件大小： | 91K |
| 代理商： | IDT6116LA55TDB |
5.1
9
IDT6116SA/LA
CMOS STATIC RAM 16K (2K x 8-BIT)
MILITARY AND COMMERCIAL TEMPERATURE RANGES
TIMING WAVEFORM OF WRITE CYCLE NO. 1, (
WE
CONTROLLED TIMING)
(1, 2, 5, 7)
TIMING WAVEFORM OF WRITE CYCLE NO. 2, (
CS
CONTROLLED TIMING)
(1, 2, 3, 5, 7)
t
WC
NOTES:
1.
WE
or
CS
must be HIGH during all address transitions.
2. A write occurs during the overlap of a LOW
CS
and a LOW
WE
.
3. tWR is measured from the earlier of
CS
or
WE
going HIGH to the end of the write cycle.
4. During this period, the I/O pins are in the output state and the input signals must not be applied.
5. If the
CS
LOW transition occurs simultaneously with or after the
WE
LOW transition, the outputs remain in the high-impedance state.
6. Transition is measured
±
500mV from steady state.
7.
OE
is continuously HIGH. If
OE
is LOW during a
WE
controlled write cycle, the write pulse width must be the larger of t
WP
or (t
WHZ
+ t
DW
) to allow the
I/O drivers to turn off and data to be placed on the bus for the required t
DW
. If
OE
is HIGH during a
WE
controlled write cycle, this requirement does not
apply and the write pulse is the specified t
WP
. For a
CS
controlled write cycle,
OE
may be LOW with no degradation to t
CW
.
CS
WE
DATA
IN
t
AW
t
CW
t
WR
(3)
t
DW
t
DH
t
AS
3089 drw 10
DATA VALID
ADDRESS
ADDRESS
DATA
OUT
CS
WE
DATA
IN
t
WC
t
AW
3089 drw 09
t
AS
t
WHZ
(6)
(4)
t
DW
t
DH
(4)
t
OW
t
WR
t
CHZ(6)
t
WP(7)
(6)
PREVIOUS DATA VALID
DATA
VALID
DATA VALID
(3)
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| IDT6116LA55TP | 制造商:IDT 制造商全稱:Integrated Device Technology 功能描述:CMOS STATIC RAM 16K (2K x 8 BIT) |
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| IDT6116LA55YB | 制造商:IDT 制造商全稱:Integrated Device Technology 功能描述:CMOS STATIC RAM 16K (2K x 8 BIT) |
| IDT6116LA70D | 制造商:IDT 制造商全稱:Integrated Device Technology 功能描述:CMOS STATIC RAM 16K (2K x 8 BIT) |
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