參數(shù)資料
型號: IDT59910A-5SOI
廠商: INTEGRATED DEVICE TECHNOLOGY INC
元件分類: 時鐘及定時
英文描述: Scan Test Devices With 18-Bit Bus Transceivers 56-SSOP -40 to 85
中文描述: PLL BASED CLOCK DRIVER, 8 TRUE OUTPUT(S), 0 INVERTED OUTPUT(S), PDSO24
封裝: 0.300 INCH, SOIC-24
文件頁數(shù): 5/6頁
文件大小: 52K
代理商: IDT59910A-5SOI
5
COMMERCIAL AND INDUSTRIAL TEMPERATURE RANGES
IDT59910A
LOW SKEW PLL CLOCK DRIVER TURBOCLOCK JR.
130
91
V
CC
Output
C
L
C
L
= 50pF (C
L
= 30pF for -2 and -5 devices)
2.0V
t
ORISE
t
OFALL
0.8V
1ns
1ns
2.0V
0.8V
3.0V
0V
Vth =1.5V
AC TEST LOADS AND WAV EFORMS
Test Load
TTL Input Test Waveform
TTL Output Waveform
REF
FB
Q
OTHER Q
t
REF
t
PD
t
SKEW
t
SKEW
t
JR
t
ODCV
t
ODCV
t
RPWH
t
RPWL
AC TIMING DIAGRAM
NOTES:
Skew:
t
SKEW
:
The time between the earliest and the latest output transition among all outputs when all are loaded with 50pF (30pF for -2 and -5) and termnated with 50
to 2.06V.
The skew between all outputs.
t
DEV
:
t
ODCV
:
t
ORISE
and t
OFALL
are measured between 0.8V and 2V.
t
LOCK
:
The time that is required before synchronization is achieved. This specification is valid only after V
CC
is stable and within normal operating limts. This parameter
is measured fromthe application of a new signal or frequency at REF or FB until t
PD
is within specified limts.
The output-to-output skew between any two devices operating under the same conditions (V
CC
,
ambient temperature, air flow, etc.)
The deviation of the output froma 50% duty cycle.
相關(guān)PDF資料
PDF描述
IDT59910A-7SO Scan Test Devices With 18-Bit Universal Bus Transceiver 64-LQFP -40 to 85
IDT59910A-2SOI LOW SKEW PLL CLOCK DRIVER TURBOCLOCK JR.
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
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