HAL525, HAL535
18
Micronas
5. Application Notes
5.1. Ambient Temperature
Due to the internal power dissipation, the temperature
on the silicon chip (junction temperature T
J
) is higher
than the temperature outside the package (ambient
temperature T
A
).
T
J
= T
A
+
T
At static conditions, the following equation is valid:
T = I
DD
* V
DD
* R
th
For typical values, use the typical parameters. For
worst case calculation, use the max. parameters for
I
DD
and R
th
, and the max. value for V
DD
from the appli-
cation.
For all sensors, the junction temperature range T
J
is
specified. The maximum ambient temperature T
Amax
can be calculated as:
T
Amax
= T
Jmax
T
5.2. Extended Operating Conditions
All sensors fulfill the electrical and magnetic character-
istics when operated within the Recommended Oper-
ating Conditions (see page 7).
Supply Voltage Below 3.8 V
Typically, the sensors operate with supply voltages
above 3 V, however, below 3.8 V some characteristics
may be outside the specification.
Note:
The functionality of the sensor below 3.8 V is not
tested. For special test conditions, please contact Mic-
ronas.
5.3. Start-up Behavior
Due to the active offset compensation, the sensors
have an initialization time (enable time t
en(O)
) after
applying the supply voltage. The parameter t
en(O)
is
specified in the Electrical Characteristics (see page 8).
During the initialization time, the output state is not
defined and the output can toggle. After t
en(O)
, the out-
put will be low if the applied magnetic field B is above
B
ON
. The output will be high if B is below B
OFF
.
For magnetic fields between B
OFF
and B
ON
, the output
state of the HAL sensor after applying V
DD
will be
either low or high. In order to achieve a well-defined
output state, the applied magnetic field must be above
B
ONmax
, respectively, below B
OFFmin
.
5.4. EMC and ESD
For applications with disturbances on the supply line or
radiated disturbances, a series resistor and a capacitor
are recommended (see Fig. 5–1). The series resistor
and the capacitor should be placed as closely as pos-
sible to the HAL sensor.
Applications with this arrangement passed the EMC
tests according to the product standards DIN 40839).
Note:
The international standard ISO 7637 is similar to
the used product standard DIN 40839.
Please contact Micronas for the detailed investigation
reports with the EMC and ESD results.
Fig. 5–1:
Test circuit for EMC investigations
R
V
220
V
EMC
V
P
4.7 nF
V
DD
OUT
GND
1
2
3
R
L
1.2 k
20 pF