GENNUM CORPORATION
521 - 96 - 07
3 of 10
G
AC ELECTRICAL CHARACTERISTICS
V
CC
= 5V, V
EE
= 0V, T
A
= 0
°
–
70
°
C unless otherwise specified.
PARAMETER
SYMBOL
CONDITIONS
MIN
TYP
MAX
UNITS
NOTES
TEST
LEVEL
Serial Data Bit Rate
BR
SDO
R
VCO
= 374
143
-
540
Mb/s
SMPTE
259M
3
Serial Data Outputs Signal
Swing
V
SDO
R
LOAD
= 37.5
, R
SET
= 54.9
740
800
860
mVp-p
1
Min. Swing (adjusted)
V
SDOMIN
R
LOAD
= 37.5
, R
SET
= 73.2
-
600
-
mVp-p
7
Max. Swing (adjusted)
V
SDOMAX
R
LOAD
= 37.5
, R
SET
= 43.2
-
1000
-
mVp-p
1
SD Rise/Fall Times
t
r
, t
f
20% - 80%
400
-
700
ps
7
SD Overshoot/Undershoot
-
-
7
%
1
7
Output Return Loss
O
RL
at 540MHz
15
-
-
dB
1
7
Lock Time
t
LOCK
Worst case
-
-
5
ms
6
Min. Loop Bandwidth
BW
MIN
270Mb/s
LBWC = Grounded : BW
MIN
-
220
-
kHz
7
Typical Loop Bandwidth
BW
TYP
270Mb/s
LBWC = Floating :
BW
MIN
-
500
-
kHz
7
Max. Loop Bandwidth
BW
MAX
270Mb/s
LBWC = V
CC
: 10 BW
MIN
-
1.7
-
MHz
7
Intrinsic Jitter (6
σ)
143Mb/s
LBWC = floating
-
0.07
-
UI
3
177Mb/s
LBWC = V
CC
-
0.07
-
270Mb/s
-
0.08
-
360Mb/s
-
0.09
-
540Mb/s
-
0.11
-
Data & Clock Inputs
(PD[9:0] PCLKIN)
t
SU
Setup Time at 25
°
C
2.5
-
-
ns
3
t
H
Hold Time at 25
°
C
2.0
-
-
ns
3
TEST LEVELS
1. Production test at room temperature and nominal supply voltage with guardbands for
supply and temperature ranges.
2. Production test at room temperature and nominal supply voltage with guardbands for
supply and temperature ranges using correlated test.
3. Production test at room temperature and nominal supply voltage.
4. QA sample test.
5. Calculated result based on Level 1,2, or 3.
6. Not tested. Guaranteed by design simulations.
7. Not tested. Based on characterization of nominal parts.
8. Not tested. Based on existing design/characterization data of similar product.
NOTES
1. Depends on PCB layout.
10