參數(shù)資料
型號(hào): GS8342D11BD-500
廠商: GSI TECHNOLOGY
元件分類: SRAM
英文描述: 4M X 9 QDR SRAM, 0.45 ns, PBGA165
封裝: 13 X 15 MM, 1 MM PITCH, FPBGA-165
文件頁(yè)數(shù): 7/31頁(yè)
文件大?。?/td> 950K
代理商: GS8342D11BD-500
20% tKHKH
VSS – 1.0 V
50%
VSS
VIH
Undershoot Measurement and Timing
Overshoot Measurement and Timing
20% tKHKH
VDD + 1.0 V
50%
VDD
VIL
Note:
Input Undershoot/Overshoot voltage must be –2 V > Vi < VDDn+2 V not to exceed 4.6 V maximum, with a pulse width not to exceed 20% tKC.
Capacitance
oC, f = 1 MHZ, VDD = 1.8 V)
Parameter
Symbol
Test conditions
Typ.
Max.
Unit
Input Capacitance
CIN
VIN = 0 V
4
5
pF
Output Capacitance
COUT
VOUT = 0 V
6
7
pF
Clock Capacitance
CCLK
VIN = 0 V
5
6
pF
Note:
This parameter is sample tested.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Rev: 1.00 4/2011
15/31
2011, GSI Technology
Preliminary
GS8342D06/11/20/38BD-550/500/450/400/350
AC Test Conditions
Parameter
Conditions
Input high level
1.25 V
Input low level
0.25 V
Max. input slew rate
2 V/ns
Input reference level
0.75 V
Output reference level
VDDQ/2
Note:
Test conditions as specified with output loading as shown unless otherwise noted.
DQ
VT = 0.75 V
50
Ω
RQ = 250
Ω (HSTL I/O)
VREF = 0.75 V
AC Test Load Diagram
(TA = 25
相關(guān)PDF資料
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GS8342D11BD-550IT 4M X 9 QDR SRAM, 0.45 ns, PBGA165
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