參數(shù)資料
型號(hào): GS832236AB-150VT
廠商: GSI TECHNOLOGY
元件分類: SRAM
英文描述: 1M X 36 CACHE SRAM, 7.5 ns, PBGA119
封裝: 14 X 22 MM, 1.27 MM PITCH, FPBGA-119
文件頁數(shù): 8/36頁
文件大小: 790K
代理商: GS832236AB-150VT
AC Test Conditions
Parameter
Conditions
DQ
VDDQ/2
50
Ω
30pF*
Output Load 1
* Distributed Test Jig Capacitance
Figure 1
Input high level
VDD – 0.2 V
Input low level
0.2 V
Input slew rate
1 V/ns
Input reference level
VDD/2
Output reference level
VDDQ/2
Output load
Fig. 1
Notes:
1. Include scope and jig capacitance.
2. Test conditions as specified with output loading as shown in Fig. 1
unless otherwise noted.
3. Device is deselected as defined by the Truth Table.
GS832218/36A(B/D)-xxxV
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Rev: 1.00a 2/2011
16/36
2011, GSI Technology
Preliminary
DC Electrical Characteristics
Parameter
Symbol
Test Conditions
Min
Max
Input Leakage Current
(except mode pins)
IIL
VIN = 0 to VDD
–1 uA
1 uA
FT, SCD, ZQ Input Current
IIN
VDD ≥ VIN ≥ 0 V
–100 uA
100 uA
Output Leakage Current
IOL
Output Disable, VOUT = 0 to VDD
–1 uA
1 uA
1.8 V Output High Voltage
VOH1
IOH = –4 mA, VDDQ = 1.7 V
VDDQ – 0.4 V
2.5 V Output High Voltage
VOH2
IOH = –8 mA, VDDQ = 2.375 V
1.7 V
1.8 V Output Low Voltage
VOL1
IOL = 4 mA
0.4 V
2.5 V Output Low Voltage
VOL2
IOL = 8 mA
0.4 V
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