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參數(shù)資料
| 型號(hào)： | FX-428-DPF-C4PMB |
| 廠商： | Vectron International, Inc. |
| 英文描述： | Low Jitter Frequency Translator |
| 中文描述： | 低抖動(dòng)頻率轉(zhuǎn)換 |
| 文件頁(yè)數(shù)： | 5/8頁(yè) |
| 文件大?。?/td> | 154K |
| 代理商： | FX-428-DPF-C4PMB |
FX-427 Low Jitter Frequency Translator
Vectron International, 267 Lowell Road, Hudson, NH 03051
Tel: 1-88-VECTRON-1
Web:
www.vectron.com
Page 5 of 8
Rev: 8Nov06
Table 4. Absolute Maximum Ratings
Parameter
Power Supply
Storage Temperature
Soldering Temp/Time
Symbol
V
CC
TS
T
LS
Ratings
0 to 6
-55 to 125
260/40
Unit
V
°
C
°
C/sec
Stresses in excess of the absolute maximum ratings can permanently damage the device. Functional operation is
not implied at these or any other conditions in excess of conditions represented in the operational sections of this
data sheet. Exposure to absolute maximum ratings for extended periods may adversely affect device reliability.
Reliability
VI qualification includes aging at various extreme temperatures, shock and vibration, temperature cycling, and IR
reflow simulation. The FX-427 family is undergoing the following qualification tests:
Environmental Compliance
Parameter
Mechanical Shock
Mechanical Vibration
Solderability
Gross and Fine Leak
Resistance to Solvents
Handling Precautions
Although ESD protection circuitry has been designed into the FX-427 proper precautions should be taken when
handling and mounting. VI employs a human body model (HBM) and a charged-device model (CDM) for ESD
susceptibility testing and design protection evaluation
ESD Ratings
Model
Minimum
Human Body Model
500 V
Charged Device Model
500 V
Conditions
MIL-STD-883, Method 2002
MIL-STD-883, Method 2007
MIL-STD-883, Method 2003
MIL-STD-883, Method 1014
MIL-STD-883, Method 2016
Conditions
MIL-STD 883, Method 3015
JEDEC, JESD22-C101
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