Philips Semiconductors
Product specification
FB2033
8-bit latched/registered/pass-thru
Futurebus+ universal interface transceiver
1995 May 25
8
AC ELECTRICAL CHARACTERISTICS
(Continued)
SYMBOL
PARAMETER
TEST
CONDITION
B PORT LIMITS
UNIT
T
amb
= +25
°
C, V
CC
= 5V,
D
= 30pF, R
U
T
amb
= 0 to 70
°
C,
V
= 5V
±
10%,
C
D
= 30pF, R
U
= 9
MIN
TYP
MAX
MIN
MAX
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PZH
t
PZL
Propagation delay (thru mode)
AIn to Bn
Waveform 1, 2
1.2
1.0
2.9
2.9
4.3
4.4
1.0
1.0
4.8
4.6
ns
Propagation delay (transparent latch)
AIn to Bn
Waveform 1, 2
1.4
1.0
3.1
3.3
4.5
4.8
1.0
1.0
5.1
5.1
ns
Propagation delay
LCAB to Bn
Waveform 1, 2
2.7
2.2
4.4
5.1
5.7
6.6
2.4
2.0
6.4
7.1
ns
Propagation delay
SABn to Bn
Waveform 1, 2
1.8
1.0
3.6
3.3
5.0
4.9
1.4
1.0
5.7
5.2
ns
Enable/disable time
OEB0 or OEB1 to Bn
Waveform 1, 2
1.4
1.0
3.0
3.1
4.5
5.0
1.0
1.0
5.0
5.6
ns
V/
t
Output transition rate, Bn Port
20% to 80%, 80% to 20%
Output to output skew, B port
1
Test Circuit and
Waveforms
0.4
1.2
V/ns
t
SK
(o)
Waveform 3
0.8
1.5
2.0
ns
t
SK
(p)
Pulse skew 2
t
PHL
– t
PLH
MAX
Waveform 2
0.3
1.5
ns
SYMBOL
PARAMETER
TEST CONDITION
R
U
= 16.5
3.0
3.0
R
U
= 16.5
1.0
1.0
UNIT
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PZH
t
PZL
Propagation delay (thru mode)
AIn to Bn
Waveform 1, 2
1.2
1.0
4.4
4.5
4.9
4.7
ns
Propagation delay (transparent latch)
AIn to Bn
Waveform 1, 2
1.4
1.0
3.2
3.4
4.6
4.9
1.0
1.0
5.2
5.2
ns
Propagation delay
LCAB to Bn
Waveform 1, 2
2.7
2.2
4.5
5.2
5.8
6.7
2.4
2.0
6.5
7.2
ns
Propagation delay
SABn to Bn
Waveform 1, 2
1.8
1.0
3.7
3.4
5.1
5.0
1.4
1.0
5.8
5.3
ns
Enable/disable time
OEB0 or OEB1 to Bn
Waveform 1, 2
1.4
1.0
3.1
3.2
4.6
5.1
1.0
1.0
5.1
5.7
ns
V/
t
Output transition rate, Bn Port
20% to 80%, 80% to 20%
Output to output skew, B port
1
Pulse skew
2
t
PHL
– t
PLH
MAX
Test Circuit and
Waveforms
0.2
0.6
V/ns
t
SK
(o)
Waveform 3
0.5
1.0
1.5
ns
t
SK
(p)
Waveform 2
0.3
1.0
1.5
ns
NOTES:
1.
t
PN
actual – t
PM
actual
for any data input to output path compared to any other data input to output path where N and M are either LH or
HL. Skew times are valid only under same test conditions (temperature, V
CC
, loading, etc.).
2. t
SK
(p) is used to quantify duty cycle characteristics. In essence it compares the input signal duty cycle to the corresponding output signal
duty cycle (50MHz input frequency and 50% duty cycle, tested on data paths only).