Philips Semiconductors
Product specification
FB2031
9-bit latched/registered/pass-thru Futurebus+ transceiver
1995 May 25
8
DC ELECTRICAL CHARACTERISTICS
(Commercial)
Over recommended operating free-air temperature range unless otherwise noted.
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
TYP
2
UNIT
MIN
MAX
100
100
I
OH
I
OFF
High level output current
Power-off output current
B0 – B8
B0 – B8
V
CC
= MAX, V
IL
= MAX, V
IH
= MIN, V
OH
= 1.9V
V
CC
= 0.0V, V
IL
= MAX, V
IH
= MIN, V
OH
= 1.9V
V
CC
= MIN, V
IL
= MAX, V
IH
= MIN, I
OH
= -24mA
V
CC
= MIN, V
IL
= MAX, V
IH
= MIN, I
OH
= -3mA
V
CC
= MIN, V
IL
= MAX, V
IH
= MIN, I
OL
= 24mA
V
CC
= MIN, V
IL
= MAX, V
IH
= MIN, I
OL
= 80mA
V
CC
= MIN, V
IL
= MAX, V
IH
= MIN, I
OL
= 100mA
V
CC
= MIN, V
IL
= MAX, V
IH
= MIN, I
OL
= 4mA
V
CC
= MIN, I
I
= I
IK
μ
A
μ
A
V
OH
High level output voltage
High-level output voltage
A0 – A8
4
2.0
2.5
V
2.85
A0 – A8
4
0.5
1.1
1.15
V
OL
Low level output voltage
Low-level output voltage
.75
1.0
V
B0 – B8
0.5
Control pins
A0 – A8
B0 – Bn
Except
B0–B8
Except
B0–B8
-0.5
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= -18mA
-1.2
V
I
I
Input current at maximum
input voltage
V
CC
= MAX, V
I
= 0.0V or 5.5V
±
50
μ
A
I
IH
Hi h l
High-level input current
V
CC
= MAX, V
I
= 2.7V
20
μ
A
B0 – B8
V
CC
= MAX, V
I
= 1.9V
V
CC
= MAX, V
I
= 3.5V
5
100
100
mA
I
IL
Low-level input current
Except
B0–B8
B0 – B8
A0 – A8
A0 – A8
A0 – A8
only
An to Bn
Bn to An
Bn to An
I
CCZ
Worst case
V
CC
= MAX, V
I
= 0.5V
-20
A
μ
V
CC
= MAX, V
I
= 0.75V
V
CC
= MAX, V
O
= 2.7V
V
CC
= MAX, V
O
= 0.5V
-100
50
-50
I
IH
+ I
OZH
I
IL
+ I
OZL
Off-state I/O High current
Off-state I/O Low current
Short-circuit output
current
3
μ
A
μ
A
I
OS
V
CC
= MAX, V
O
= 0.0V
-45
-150
mA
V
CC
= MAX, outputs Low or High
V
CC
= MAX, outputs Low
V
CC
= MAX, outputs High
V
CC
= MAX, outputs 3-State
V
CC
= MAX, all A and B outputs on
17
50
25
28
50
30
78
45
50
78
I
CC
Supply current (total)
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operation conditions for the applicable type.
2. All typical values are at V
= 5V, T
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
4. Due to test equipment limitations, actual test conditions are V
IH
= 1.8V and V
IL
= 1.3V for the B side.
5. For B port input voltage between 3 and 5 volts I
IH
will be greater than 100
μ
A, but the parts will continue to function normally.
6. B0 – B8 clamps remain active for a minimum of 80ns following a High-to-Low transition.