參數(shù)資料
型號: EP20K400E
廠商: Altera Corporation
英文描述: Programmable Logic Device Family
中文描述: 可編程邏輯器件系列
文件頁數(shù): 59/117頁
文件大?。?/td> 570K
代理商: EP20K400E
Altera Corporation
59
APEX 20K Programmable Logic Device Family Data Sheet
Figure 32. APEX 20K AC Test Conditions
Note (1)
Note to
Figure 32
:
(1)
Power supply transients can affect AC measurements. Simultaneous transitions of
multiple outputs should be avoided for accurate measurement. Threshold tests
must not be performed under AC conditions. Large-amplitude, fast-ground-
current transients normally occur as the device outputs discharge the load
capacitances. When these transients flow through the parasitic inductance between
the device ground pin and the test system ground, significant reductions in
observable noise immunity can result.
Operating
Conditions
Tables 23
through
26
provide information on absolute maximum ratings,
recommended operating conditions, DC operating conditions, and
capacitance for 2.5-V APEX 20K devices.
System
C1 (includes
JIG capacitance)
Device input
rise and fall
times < 3 ns
Device
Output
to Test
Table 23. APEX 20K 5.0-V Tolerant Device Absolute Maximum Ratings
Notes (1)
,
(2)
Symbol
Parameter
Conditions
Min
Max
Unit
V
CCINT
V
CCIO
V
I
I
OUT
T
STG
T
AMB
T
J
Supply voltage
With respect to ground
(3)
–0.5
3.6
V
–0.5
4.6
V
DC input voltage
–2.0
5.75
V
DC output current, per pin
–25
25
mA
Storage temperature
No bias
–65
150
° C
Ambient temperature
Under bias
–65
135
° C
Junction temperature
PQFP, RQFP, TQFP, and BGA packages,
under bias
135
° C
Ceramic PGA packages, under bias
150
° C
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