參數(shù)資料
型號: EP20K100
廠商: Altera Corporation
英文描述: Programmable Logic Device Family
中文描述: 可編程邏輯器件系列
文件頁數(shù): 58/117頁
文件大?。?/td> 570K
代理商: EP20K100
58
Altera Corporation
APEX 20K Programmable Logic Device Family Data Sheet
Table 22
shows the JTAG timing parameters and values for APEX 20K
devices.
f
For more information, see the following documents:
Application Note 39 (IEEE Std. 1149.1 (JTAG) Boundary-Scan Testing in
Altera Devices)
Jam Programming & Test Language Specification
Generic Testing
Each APEX 20K device is functionally tested. Complete testing of each
configurable static random access memory (SRAM) bit and all logic
functionality ensures 100
%
yield. AC test measurements for APEX 20K
devices are made under conditions equivalent to those shown in
Figure 32
. Multiple test patterns can be used to configure devices during
all stages of the production flow.
Table 22. APEX 20K JTAG Timing Parameters & Values
Symbol
Parameter
Min
Max
Unit
t
JCP
t
JCH
t
JCL
t
JPSU
t
JPH
t
JPCO
t
JPZX
t
JPXZ
t
JSSU
t
JSH
t
JSCO
t
JSZX
t
JSXZ
TCK
clock period
100
ns
TCK
clock high time
50
ns
TCK
clock low time
50
ns
JTAG port setup time
20
ns
JTAG port hold time
45
ns
JTAG port clock to output
25
ns
JTAG port high impedance to valid output
25
ns
JTAG port valid output to high impedance
25
ns
Capture register setup time
20
ns
Capture register hold time
45
ns
Update register clock to output
35
ns
Update register high impedance to valid output
35
ns
Update register valid output to high impedance
35
ns
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