參數(shù)資料
型號: DS21554LN
廠商: Maxim Integrated Products
文件頁數(shù): 115/124頁
文件大?。?/td> 0K
描述: IC TXRX E1 1-CHIP 5V 100-LQFP
產(chǎn)品培訓(xùn)模塊: Lead (SnPb) Finish for COTS
產(chǎn)品變化通告: Product Discontinuation 20/Feb/2012
標(biāo)準(zhǔn)包裝: 90
功能: 單芯片收發(fā)器
接口: E1,HDLC,J1,T1
電路數(shù): 1
電源電壓: 4.75 V ~ 5.25 V
電流 - 電源: 75mA
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 100-LQFP
供應(yīng)商設(shè)備封裝: 100-LQFP(14x14)
包裝: 托盤
包括: 遠程和 AIS 警報檢測器 / 發(fā)生器
DS21354/DS21554 3.3V/5V E1 Single-Chip Transceivers
90 of 124
16.
JTAG BOUNDARY SCAN ARCHITECTURE AND TEST ACCESS PORT
The
DS21354/DS21554
IEEE
1149.1
design
supports
the
standard
instruction
codes
SAMPLE/PRELOAD, BYPASS, and EXTEST. Optional public instructions included are HIGHZ,
CLAMP, and IDCODE. See Figure 16-1. The device contains the following as required by IEEE 1149.1
Standard Test Access Port and Boundary Scan Architecture.
Test Access Port (TAP)
TAP Controller
Instruction Register
Bypass Register
Boundary Scan Register
Device Identification Register
The DS21354/DS21554 are enhanced versions of the DS2152 and are backward pin compatible. The
JTAG feature uses pins that had no function in the DS2152. When using the JTAG feature, be sure FMS
(pin 76) is tied low, enabling the newly defined pins of the DS21354/DS21554. Details on Boundary
Scan Architecture and the Test Access Port can be found in IEEE 1149.1-1990, IEEE 1149.1a-1993, and
IEEE 1149.1b-1994.
The Test Access Port has the necessary interface pins: JTRST, JTCLK, JTMS, JTDI, and JTDO. See the
pin descriptions in Section 3 for details.
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