參數(shù)資料
型號(hào): DAC8574EVM
廠商: Texas Instruments, Inc.
英文描述: DAC8574 Evaluation Module(DAC8574評(píng)估板)
中文描述: DAC8574評(píng)估模塊(DAC8574評(píng)估板)
文件頁數(shù): 18/32頁
文件大?。?/td> 502K
代理商: DAC8574EVM
EVM Performance
2-6
2.2
EVM Performance
The EVM performance test is performed using a high density DAC bench test
board, an Agilent 3458A digital multimeter, and a PC running the LABVIEW
software. The EVM board is tested for all codes of 65535 and the device under
test (DUT) is allowed to settle for 1ms before the meter is read. This process
is repeated for all codes to generate the measurements for INL and DNL
results and is shown in Figure 2-9.
The parameters and results of the DAC8574 EVM characterization test can be
seen in Figure 2-8.
Figure 2-8. DAC8574 EVM Test Parameters and Results
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