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參數(shù)資料
| 型號： | DAC8544I |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | QUAD, 16-BIT, RAIL-TO-RAIL VOLTAGE OUTPUT, PARALLEL INTERFACE, DIGITAL-TO-ANALOG CONVERTER |
| 中文描述： | 四，16位，軌到軌電壓輸出，并行接口，數(shù)字模擬轉(zhuǎn)換器 |
| 文件頁數(shù)： | 8/20頁 |
| 文件大小： | 476K |
| 代理商： | DAC8544I |
www.ti.com
TYPICAL CHARACTERISTICS
0.005
0.004
0.003
0.002
0.001
0
0.001
0.002
0.003
0.004
0.005
0
10000
20000
30000
40000
50000
60000
Digital Input Code
T
3
2
1
0
1
2
3
40
20
0
T
A
Free-Air Temperature
°
C
20
40
60
80
100
Gain
Full-Scale
Zero-Scale
V
DD
= 5.5 V
E
5
0
5
10
15
20
25
30
35
40
1
0.4
0
0.4
1
T
A
= 25
°
C
P
Offset Error mV
0.2
0.6
0.8
0.2
0.6
0.8
3
2
1
0
1
2
3
40
20
0
T
A
Free-Air Temperature
°
C
20
40
60
80
100
Gain
Full-Scale
Zero-Scale
V
DD
= 3.6 V
E
0
5
10
15
20
25
1
0.8
0.6 0.4
0.2
Gain Error mV
0
0.2
0.4
0.6
0.8
1
T
A
= 25
°
C
P
0
5
10
15
20
25
1
0.8
0.6
0.4
0.2
Full Scale Error mV
0
0.2
0.4
0.6
0.8
1
T
A
= 25
°
C
P
DAC8544
SLAS420–MAY 2004
This condition applies to all typical characteristics: V
REF+
= V
DD
, V
REF–
= GND, T
A
= 25
°
C (unless otherwise noted)
TOTAL UNADJUSTED ERROR
vs
DIGITAL INPUT CODE
ERROR
vs
TEMPERATURE
Figure 1.
Figure 2.
ERROR
vs
OFFSET ERROR DISTRIBUTION
(ACROSS MANY SAMPLES)
TEMPERATURE
Figure 3.
Figure 4.
GAIN ERROR DISTRIBUTION
(ACROSS MANY SAMPLES)
FULL SCALE ERROR DISTRIBUTION
(ACROSS MANY SAMPLES)
Figure 5.
Figure 6.
8
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