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參數(shù)資料
| 型號： | D1217 |
| 廠商： | TT electronics Semelab Limited |
| 英文描述： | METAL GATE RF SILICON FET |
| 中文描述： | 金屬門射頻硅場效應管 |
| 文件頁數(shù)： | 2/2頁 |
| 文件大?。?/td> | 17K |
| 代理商： | D1217 |
D1217UK
Prelim. 9/00
Semelab plc.
Telephone +44(0)1455 556565. Fax +44(0)1455 552612.
E-mail:
sales@semelab.co.uk
http://www.semelab.co.uk40
2
1
1
5.5
1.6
10
50
20:1
120
80
8
Parameter
Test Conditions
PER SIDE
Min.
Typ.
Max.
Unit
V
GS
= 0
I
D
= 100mA
V
DS
= 12.5V
V
GS
= 0
V
GS
= 20V
I
D
= 10mA
V
DS
= 10V
V
DS
= 0
V
DS
= V
GS
I
D
= 2A
P
O
= 40W
V
DS
= 12.5V
f = 400MHz
I
DQ
= 1.6A
V
DS
= 0V
V
DS
= 12.5V V
GS
= 0
V
DS
= 12.5V V
GS
= 0
V
GS
=
–
5V f = 1MHz
f = 1MHz
f = 1MHz
V
mA
m
A
V
S
dB
%
—
pF
pF
pF
ELECTRICAL CHARACTERISTICS
(T
case
= 25
°
C unless otherwise stated)
Drain
–
Source
Breakdown Voltage
Zero Gate Voltage
Drain Current
Gate Leakage Current
V
GS(th)
Gate Threshold Voltage*
g
fs
Forward Transconductance*
BV
DSS
I
DSS
I
GSS
G
PS
Common Source Power Gain
Drain Efficiency
Load Mismatch Tolerance
h
VSWR
C
iss
C
oss
C
rss
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
HAZARDOUS MATERIAL WARNING
The ceramic portion of the device between leads and metal flange is beryllium oxide. Beryllium oxide dust is highly
toxic and care must be taken during handling and mounting to avoid damage to this area.
THESE DEVICES MUST NEVER BE THROWN AWAY WITH GENERAL INDUSTRIAL OR DOMESTIC WASTE.
R
THj
–
case
Thermal Resistance Junction
–
Case
Max. 1.0
°
C / W
THERMAL DATA
* Pulse Test:
Pulse Duration = 300
m
s , Duty Cycle
￡
2%
TOTAL DEVICE
PER SIDE
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|---|---|
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相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| D1217U | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:CASSETTE DETAILS |
| D1217UK | 制造商:SEME-LAB 制造商全稱:Seme LAB 功能描述:METAL GATE RF SILICON FET |
| D1218 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:Control/Communicators |
| D12-1802F | 制造商:Vishay Roederstein 功能描述:CR0805-1802F |
| D1218UK | 制造商:TT Electronics / Semelab 功能描述:RF POWER TRANSISTOR MOSFET |
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