參數(shù)資料
型號: CY62148L-55SC
廠商: CYPRESS SEMICONDUCTOR CORP
元件分類: DRAM
英文描述: 512K x 8 Static RAM
中文描述: 512K X 8 STANDARD SRAM, 55 ns, PDSO32
封裝: 0.450 INCH, PLASTIC, SOIC-32
文件頁數(shù): 2/7頁
文件大?。?/td> 200K
代理商: CY62148L-55SC
CY62148
2
PRELIMINARY
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature .................................–65
°
C to +150
°
C
Ambient Temperature with
Power Applied.............................................–55
°
C to +125
°
C
Supply Voltage on V
CC
to Relative GND
[1]
.... –0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State
[1]
.....................................–0.5V to V
CC
+0.5V
Electrical Characteristics
Over the Operating Range
[3]
DC Input Voltage
[1]
................................. –0.5V to V
CC
+0.5V
Current into Outputs (LOW) ........................................ 20 mA
Operating Range
Range
Ambient
Temperature
[2]
0
°
C to +70
°
C
–40
°
C to +85
°
C
V
CC
Commercial
Industrial
5V
±
10%
5V
±
10%
62148–55
62148–70
Parameter
V
OH
V
OL
V
IH
Description
Test Conditions
Min.
2.4
Max.
Min.
2.4
Max.
Unit
V
Output HIGH Voltage
V
CC
= Min., I
OH
= –1 mA
V
CC
= Min., I
OL
= 2.1 mA
Output LOW Voltage
0.4
0.4
V
Input HIGH Voltage
2.2
V
CC
+
0.3
2.2
V
CC
+
0.3
V
V
IL
I
IX
I
OZ
I
CC
Input LOW Voltage
[1]
–0.3
0.8
–0.3
0.8
V
μ
A
μ
A
mA
Input Load Current
GND
V
I
V
CC
GND
V
I
V
CC
, Output Disabled
V
CC
= Max.
,
I
OUT
= 0 mA,
f = f
MAX
= 1/t
RC
Max. V
CC
, CE
V
IH
V
IN
V
IH
or
V
IN
V
IL
, f = f
MAX
Max. V
CC
,
CE
V
CC
– 0.3V,
V
IN
V
CC
– 0.3V,
or V
IN
0.3V, f=0
–1
+1
–1
+1
Output Leakage Current
–5
+5
–5
+5
V
CC
Operating
Supply Current
Com’l
120
120
I
SB1
Automatic CE
Power-Down Current
—TTL Inputs
Com’l
15
15
mA
I
SB2
Automatic CE
Power-Down Current
—CMOS Inputs
Com’l
2
2
mA
μ
A
L
500
500
Shaded areas contain advance information
Capacitance
[5]
Parameter
Description
Test Conditions
Max.
10
10
Unit
pF
pF
C
IN
C
OUT
Notes:
1.
2.
3.
4.
5.
Input Capacitance
Output Capacitance
T
A
= 25
°
C, f = 1 MHz,
V
CC
= 5.0V
V
IL
(min.) = –2.0V for pulse durations of less than 20 ns.
T
is the “instant on” case temperature.
See the last page of this specification for Group A subgroup testing information.
Not more than one output should be shorted at one time. Duration of the short circuit should not exceed 30 seconds.
Tested initially and after any design or process changes that may affect these parameters.
相關PDF資料
PDF描述
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