參數(shù)資料
型號(hào): CY62138V
廠商: Cypress Semiconductor Corp.
英文描述: 256K x 8 Static RAM
中文描述: 256K × 8靜態(tài)RAM
文件頁(yè)數(shù): 2/9頁(yè)
文件大小: 175K
代理商: CY62138V
CY7C1020
2
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature .................................
65
°
C to +150
°
C
Ambient Temperature with
Power Applied.............................................
55
°
C to +125
°
C
Supply Voltage on V
CC
to Relative GND
[1]
....
0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State
[1]
.....................................
0.5V to V
CC
+0.5V
DC Input Voltage
[1]
..................................
0.5V to V
CC
+0.5V
Current into Outputs (LOW)......................................... 20 mA
Static Discharge Voltage ...........................................>2001V
(per MIL-STD-883, Method 3015)
Latch-Up Current..................................................... >200 mA
Operating Range
Range
Ambient
Temperature
[2]
0
°
C to +70
°
C
V
CC
Commercial
4.5V
5.5V
Electrical Characteristics
Over the Operating Range
Parameter
V
OH
V
OL
V
IH
V
IL
I
IX
I
OZ
Description
Test Conditions
V
CC
= Min., I
OH
=
4.0 mA
V
CC
= Min., I
OL
= 8.0 mA
7C1020-10
Min.
2.4
7C1020-12
Min.
2.4
7C1020-15
Min.
2.4
Unit
V
Max.
Max.
Max.
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
[1]
Input Load Current
0.4
6.0
0.4
6.0
0.4
6.0
V
V
2.2
2.2
2.2
0.5
1
0.8
+1
0.5
1
0.8
+1
0.5
1
0.8
+1
V
μ
A
μ
A
GND < V
I
< V
CC
GND < V
I
< V
CC
,
Output Disabled
Output Leakage
Current
2
+2
2
+2
2
+2
I
CC
V
CC
Operating
Supply Current
V
CC
= Max.,
I
OUT
= 0 mA,
f = f
MAX
= 1/t
RC
Max. V
CC
, CE > V
IH
V
IN
> V
IH
or
V
IN
< V
IL
, f = f
MAX
Max. V
CC
,
CE > V
CC
0.3V,
V
IN
> V
CC
0.3V,
or V
IN
< 0.3V, f = 0
180
150
170
140
160
130
mA
L
I
SB1
Automatic CE
Power-Down Current
TTL Inputs
Automatic CE
Power-Down Current
CMOS Inputs
20
20
20
mA
L
10
10
10
I
SB2
3
3
3
mA
μ
A
L
100
100
100
Notes:
1.
2.
V
IL
(min.) =
2.0V for pulse durations of less than 20 ns.
T
A
is the case temperature.
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