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參數(shù)資料
| 型號： | CY54FCT841TDIP |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | 10-Bit Latch |
| 中文描述： | 10位鎖存器 |
| 文件頁數(shù)： | 3/8頁 |
| 文件大?。?/td> | 84K |
| 代理商： | CY54FCT841TDIP |
CY54/74FCT841T
3
Electrical Characteristics
Over the Operating Range
Parameter
V
OH
Description
Test Conditions
Min.
2.0
2.4
2.4
Typ.
[5]
Max.
Unit
V
V
V
V
V
V
V
V
V
μ
A
μ
A
μ
A
μ
A
Output HIGH Voltage
V
CC
= Min., I
OH
=
32 mA
V
CC
= Min., I
OH
=
15 mA
V
CC
= Min., I
OH
=
12 mA
V
CC
= Min., I
OL
= 64 mA
V
CC
= Min., I
OL
= 32 mA
Com’l
Com’l
Mil
Com’l
Mil
3.3
3.3
0.3
0.3
V
OL
Output LOW Voltage
0.55
0.55
V
IH
V
IL
V
H
V
IK
I
I
I
IH
I
IL
I
OZH
Input HIGH Voltage
Input LOW Voltage
Hysteresis
[6]
Input Clamp Diode Voltage
Input HIGH Current
Input HIGH Current
Input LOW Current
Off State HIGH-Level Output
Current
Off State LOW-Level
Output Current
Output Short Circuit Current
[7]
Power-Off Disable
2.0
0.8
All inputs
V
CC
= Min., I
IN
=
18 mA
V
CC
= Max., V
IN
= V
CC
V
CC
= Max., V
IN
= 2.7V
V
CC
= Max., V
IN
= 0.5V
V
CC
= Max., V
OUT
= 2.7V
0.2
0.7
1.2
5
±
1
±
1
10
I
OZL
V
CC
= Max., V
OUT
= 0.5V
10
μ
A
I
OS
I
OFF
V
CC
= Max., V
OUT
= 0.0V
V
CC
= 0V, V
OUT
= 4.5V
60
120
225
±
1
mA
μ
A
Capacitance
[6]
Parameter
Description
Typ.
[5]
5
9
Max.
10
12
Unit
pF
pF
C
IN
C
OUT
Notes:
5.
6.
7.
Input Capacitance
Output Capacitance
Typical values are at V
=5.0V, T
=+25C ambient.
This parameter is specified but not tested.
Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, I
OS
tests should be performed last.
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