CY28323PVC
. Document #: 38-07004 Rev. *B Page Page 17 of 21 of 21
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Switching Characteristics[[3]] Over the Operating Range Parameter
Output
Description
Test Conditions
Min.
Max.
Unit
t1
All
t1A/(t1B)
45
55
%
t2
CPU
Rise Time
Measured at 20% to 80% of Voh
175
700
ps
t2
48MHz, REF
Rising Edge Rate
Between 0.4V and 2.4V
0.5
2.0
V/ns
t2
PCI, 3V66,
Rising Edge Rate
Between 0.4V and 2.4V
1.0
4.0
V/ns
t3
CPU
Fall Time
Measured at 80% to 20% of Voh
175
700
ps
t3
48MHz, REF
Falling Edge Rate
Between 2.4V and 0.4V
0.5
2.0
V/ns
t3
PCI, 3V66
Falling Edge Rate
Between 2.4V and 0.4V
1.0
4.0
V/ns
t4
CPU
CPU-CPU Skew
Measured at Crossover
150
ps
t5
3V66 [0:1]
3V66-3V66 Skew
Measured at 1.5V
500
ps
t6
PCI
PCI-PCI Skew
Measured at 1.5V
500
ps
t7
3V66,PCI
3V66-PCI Clock Skew
3V66 leads. Measured at 1.5V
1.5
3.5
ns
t8
CPU
Cycle-Cycle Clock Jitter
Measured at Crossover t8 = t8A – t8B
With all outputs running
200
ps
t9
3V66
Cycle-Cycle Clock Jitter
Measured at 1.5V t9 = t9A – t9B
250
ps
t9
48MHz
Cycle-Cycle Clock Jitter
Measured at 1.5V t9 = t9A – t9B
350
ps
t9
PCI
Cycle-Cycle Clock Jitter
Measured at 1.5V t9 = t9A – t9B
500
ps
t9
REF
Cycle-Cycle Clock Jitter
Measured at 1.5V t9 = t9A – t9B
1000
ps
CPU, PCI
Settle Time
CPU and PCI clock stabilization from
power-up
3
ms
CPU
Rise/Fall Matching
20%
CPU
Overshoot
Measured with test loads
[[6]]Voh +
0.2
V
CPU
Undershoot
Measured with test loads
[[6]]–0.2
V
Voh
CPU
High-level Output Voltage
Measured with test loads
[[6]]0.65
0.74
V
Vol
CPU
Low-level Output Voltage
Measured with test loads
[[6]]0.0
0.05
V
Vcrossover
CPU
Crossover Voltage
Measured with test loads
[[6]]45%
of
0.65
55%
of
0.74
V
Notes:
3. All parameters specified with loaded outputs.
4. Duty cycle is measured at 1.5V when VDD = 3.3V. When VDD = 2.5V, duty cycle is measured at 1.25V.
5. Determined as a fraction of 2*(tRP – tRN)/(tRP +tRN) Where tRP is a rising edge and tRN is an intersecting falling edge.
6. The test load is Rs = 33.2, Rp = 49.9 in test circuit.