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參數(shù)資料
| 型號： | CG7C324-A30JC |
| 英文描述： | UV-Erasable/OTP PLD |
| 中文描述： | UV-Erasable/OTP可編程邏輯器件 |
| 文件頁數(shù)： | 5/13頁 |
| 文件大?。?/td> | 326K |
| 代理商： | CG7C324-A30JC |
PLDC20RA10
5
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature .................................
–
65
°
C to +150
°
C
Ambient Temperature with
Power Applied.............................................
–
55
°
C to +125
°
C
Supply Voltage to Ground Potential
(Pin 24 to Pin 12)...........................................
–
0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State...............................................
–
0.5V to +7.0V
DC Input Voltage.........................................
–
3.0 V to + 7.0 V
Output Current into Outputs (LOW) .............................16 mA
Static Discharge Voltage ...........................................>2001V
(per MIL-STD-883, Method 3015)
Latch-Up Current..................................................... >200 mA
DC Program Voltage..................................................... 13.0V
]
Operating Range
Range
Ambient
Temperature
0
°
C to +75
°
C
–
55
°
C to +125
°
C
V
CC
Commercial
Military
[2]
5V
±
10%
5V
±
10%
Electrical Characteristics
Over the Operating Range
[3]
Parameter
V
OH
Description
Test Conditions
I
OH
=
–
3.2 mA
I
OH
=
–
2 mA
I
OL
= 8 mA
Min.
2.4
Max.
Unit
V
Output HIGH Voltage
V
CC
= Min.,
V
IN
=V
IH
or V
IL
Com
’
l
Mil
V
OL
Output LOW Voltage
V
CC
= Min.,
V
IN
= V
IH
or V
IL
Guaranteed Input Logical HIGH Voltage for All Inputs
[4]
Guaranteed Input Logical LOW Voltage for All Inputs
[4]
V
SS
≤
V
IN
≤
V
CC
, V
CC
= Max
V
CC
= Max., V
SS
≤
V
OUT
≤
V
CC
V
CC
= Max., V
OUT
= 0.5V
[6]
V
CC
= Max., V
IN
= GND Outputs Open
0.5
V
V
IH
V
IL
I
IX
I
OZ
I
SC
I
CC1
Input HIGH Level
2.0
V
Input LOW Level
0.8
V
μ
A
μ
A
mA
Input Leakage Current
–
10
+10
Output Leakage Current
Output Short Circuit Current
[5]
–
40
+40
–
30
–
90
Standby Power Supply Current
Com
’
l
75
mA
Mil
80
mA
I
CC2
Power Supply Current at
Frequency
[5]
V
CC
= Max., Outputs Disabled (In High Z
State) Device Operating at f
MAX
Com
’
l
80
mA
Mil
85
mA
Capacitance
[5]
Parameter
Description
Test Conditions
V
IN
= 2.0 V @ f = 1 MHz
V
OUT
= 2.0 V @ f = 1 MHz
Max.
10
10
Unit
pF
pF
C
IN
C
OUT
Notes:
2.
3.
4.
5.
6.
Input Capacitance
Output Capacitance
T
is the
“
instant on
”
case temperature.
See the last page of this specification for Group A subgroup testing information.
These are absolute values with respect to device ground and all overshoots due to system or tester noise are included.
Tested initially and after any design or process changes that may affect these parameters.
Not more than one output should be tested at a time. Duration of the short circuit should not be more than one second. V
OUT
= 0.5 V has been chosen to
avoid test problems caused by tester ground degradation.
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