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參數(shù)資料
| 型號： | BDGLA16NB-TR |
| 英文描述： | Quad Differential Drivers BDG1A, BDP1A, BDGLA, BPNGA, BPNPA, and BPPGA |
| 中文描述： | 四路差分驅(qū)動BDG1A，BDP1A，BDGLA，BPNGA，BPNPA和BPPGA |
| 文件頁數(shù)： | 9/16頁 |
| 文件大?。?/td> | 326K |
| 代理商： | BDGLA16NB-TR |
Lucent Technologies Inc.
9
Data Sheet
January 1999
BDG1A, BDP1A, BDGLA, BPNGA, BPNPA, and BPPGA
Quad Differential Drivers
ESD Failure Models
Lucent employs two models for ESD events that can
cause device damage or failure.
1.
A human-body model (HBM) that is used by most
of the industry for ESD-susceptibility testing and
protection-design evaluation. ESD voltage thresh-
olds are dependent on the critical parameters used
to define the model. A standard HBM (resistance =
1500
, capacitance = 100 pF) is widely used and,
therefore, can be used for comparison purposes.
2.
A charged-device model (CDM), which many
believe is the better simulator of electronics manu-
facturing exposure.
Tables 5 and 6 illustrate the role these two models play
in the overall prevention of ESD damage. HBM ESD
testing is intended to simulate an ESD event from a
charged person. The CDM ESD testing simulates
charging and discharging events that occur in produc-
tion equipment and processes, e.g., an integrated cir-
cuit sliding down a shipping tube.
The HBM ESD threshold voltage presented here was
obtained by using these circuit parameters.
Table 5. Typical ESD Thresholds for Data
Transmission Drivers
Table 6. ESD Damage Protection
Device
HBM
Threshold
>
2500
>
2500
>
3000
CDM
Threshold
>
1000
>
2000
>
2000
BDG1A, BDGLA
BDP1A
BPPGA, BPNGA,
BPNPA
ESD Threat Controls
Personnel
Wrist straps
ESD shoes
Antistatic flooring
Human-body model
(HBM)
Processes
Static-dissipative
materials
Air ionization
Charged-device
model (CDM)
Control
Model
Latch-Up
Latch-up evaluation has been performed on the data transmission drivers. Latch-up testing determines if power-
supply current exceeds the specified maximum due to the application of a stress to the device under test. A device
is considered susceptible to latch-up if the power supply current exceeds the maximum level and remains at that
level after the stress is removed.
Lucent performs latch-up testing per an internal test method that is consistent with JEDEC Standard No. 17 (previ-
ously JC-40.2) “CMOS Latch-Up Standardized Test Procedure.”
Latch-up evaluation involves three separate stresses to evaluate latch-up susceptibility levels:
1. dc current stressing of input and output pins.
2. Power supply slew rate.
3. Power supply overvoltage.
Table 7. Latch-Up Test Criteria and Test Results
Based on the results in Table 6, the data transmission drivers pass the Lucent latch-up testing requirements and
are considered not susceptible to latch-up.
dc Current Stress of
I/O Pins
≥
150 mA
≥
250 mA
Power Supply
Slew Rate
≤
1
μs
≤
100 ns
Power Supply
Overvoltage
≥
1.75
×
Vmax
≥
2.25
×
Vmax
Data Transmission
Driver ICs
Minimum Criteria
Test Results
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| BDGLA16P | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
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| BDH105 | 功能描述:控制開關(guān) BDH105 RoHS:否 制造商:Omron Industrial 控制類型:Emergency Stop 觸點(diǎn)額定值:5 A at 125 VAC 觸點(diǎn)形式:1 Form B (SPST-NC) 電壓額定值: 電流額定值: 執(zhí)行器:Pushbutton 照明:N 安裝風(fēng)格: |
| BDH106 | 功能描述:控制開關(guān) BDH106 RoHS:否 制造商:Omron Industrial 控制類型:Emergency Stop 觸點(diǎn)額定值:5 A at 125 VAC 觸點(diǎn)形式:1 Form B (SPST-NC) 電壓額定值: 電流額定值: 執(zhí)行器:Pushbutton 照明:N 安裝風(fēng)格: |
| BDH106SH | 功能描述:SIDE HANDLE BLACK FOR 30A SWITCH RoHS:是 類別:過電壓，電流，溫度裝置 >> 斷連開關(guān)元件 系列:- 標(biāo)準(zhǔn)包裝:10 系列:TPCDS 類型:開關(guān) 電壓:80V 電流:3 ~ 125A |
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