
AN80xx/AN80xxM Series
4
SFF00007CEB
I
Electrical Characteristics at T
a
=
25
°
C (continued)
AN8045, AN8045M (4.5V type)
Parameter
Output voltage
Line regulation
AN8005, AN8005M (5V type)
AN8006, AN8006M (6V type)
V
O
V
REG
IN
mV
mV
mV
REG
L
V
DIF(min)
V
V
mA
I
Bias
RR
dB
μ
V
V
no
mV/
°
C
V
O
/T
a
4.68
50
4.5
T
j
=
25
°
C
V
I
=
5 to 10.5V, T
j
=
25
°
C
I
O
=
1 to 40mA, T
j
=
25
°
C
I
O
=
1 to 50mA, T
j
=
25
°
C
35
45
0.07
V
I
=
4.3V, I
O
=
20mA, T
j
=
25
°
C
V
I
=
4.3V, I
O
=
50mA, T
j
=
25
°
C
I
O
=
0mA, T
j
=
25
°
C
V
I
=
5.5 to 7.5V, f
=
120Hz
f
=
10Hz to 100kHz
T
j
=
30 to
+
125
°
C
0.7
0.23
0.2
0.3
1
4.32
54
0.12
4
11
23
85
66
Symbol
Conditions
Min
Typ
Max
Load regulation
Minimum input/output voltage difference
Note 1) The specified condition T
j
=
25
°
C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
5.5V, I
O
=
20mA and C
O
=
10
μ
F.
Bias current
Ripple rejection ratio
Output noise voltage
Output voltage temperature coefficient
Unit
V
O
V
REG
IN
mV
mV
mV
REG
L
V
DIF(min)
V
V
mA
I
Bias
RR
dB
μ
V
V
no
mV/
°
C
V
O
/T
a
5.2
50
5
T
j
=
25
°
C
V
I
=
5.5 to 11V, T
j
=
25
°
C
I
O
=
1 to 40mA, T
j
=
25
°
C
I
O
=
1 to 50mA, T
j
=
25
°
C
40
50
0.07
V
I
=
4.8V, I
O
=
20mA, T
j
=
25
°
C
V
I
=
4.8V, I
O
=
50mA, T
j
=
25
°
C
I
O
=
0mA, T
j
=
25
°
C
V
I
=
6 to 8V, f
=
120Hz
f
=
10Hz to 100kHz
T
j
=
30 to
+
125
°
C
0.7
0.25
0.2
0.3
1
4.8
52
0.12
4.5
12
25
95
64
Parameter
Symbol
Conditions
Min
Typ
Max
Output voltage
Line regulation
Load regulation
Minimum input/output voltage difference
Note 1) The specified condition T
j
=
25
°
C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
6V, I
O
=
20mA and C
O
=
10
μ
F.
Bias current
Ripple rejection ratio
Output noise voltage
Output voltage temperature coefficient
Unit
V
O
V
REG
IN
mV
mV
mV
REG
L
V
DIF(min)
V
V
mA
I
Bias
RR
dB
μ
V
V
no
mV/
°
C
V
O
/T
a
6.24
60
6
T
j
=
25
°
C
V
I
=
6.5 to 12V, T
j
=
25
°
C
I
O
=
1 to 40mA, T
j
=
25
°
C
I
O
=
1 to 50mA, T
j
=
25
°
C
45
55
0.07
V
I
=
5.8V, I
O
=
20mA, T
j
=
25
°
C
V
I
=
5.8V, I
O
=
50mA, T
j
=
25
°
C
I
O
=
0mA, T
j
=
25
°
C
V
I
=
7 to 9V, f
=
120Hz
f
=
10Hz to 100kHz
T
j
=
30 to
+
125
°
C
0.7
0.3
0.2
0.3
1.2
5.76
51
0.13
5.5
13
28
105
63
Parameter
Symbol
Conditions
Min
Typ
Max
Output voltage
Line regulation
Load regulation
Minimum input/output voltage difference
Note 1) The specified condition T
j
=
25
°
C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
7V, I
O
=
20mA and C
O
=
10
μ
F.
Bias current
Ripple rejection ratio
Output noise voltage
Output voltage temperature coefficient
Unit