參數(shù)資料
型號: AN78LxxM
廠商: Panasonic Corporation
元件分類: 圓形連接器
英文描述: Circular Connector Shell; MIL SPEC:MIL-C-5015 A/B/C; Body Material:Aluminum Alloy; Series:97-3100; Connector Shell Size:22; Connecting Termination:Solder; Circular Shell Style:Wall Mount Receptacle; Gender:Male-Female Adapter
中文描述: 3針正輸出電壓調(diào)節(jié)器(100毫安型)
文件頁數(shù): 7/12頁
文件大?。?/td> 179K
代理商: AN78LXXM
AN78Lxx/AN78LxxM Series
7
SFF00005CEB
I
Electrical Characteristics at T
a
=
25
°
C (continued)
AN78L18, AN78L18M (18V type)
AN78L20, AN78L20M (20V type)
V
O
V
O
18.7
18.9
V
V
18
V
I
=
20.5 to 33V, I
O
=
1 to 70mA
V
I
=
20.5 to 33V, T
j
=
25
°
C
V
I
=
21 to 33V, T
j
=
25
°
C
REG
IN
300
250
mV
mV
45
35
REG
L
mV
30
I
O
=
1 to 100mA, T
j
=
25
°
C
I
O
=
1 to 40mA, T
j
=
25
°
C
T
j
=
25
°
C
V
I
=
21 to 33V, T
j
=
25
°
C
I
O
=
1 to 40mA, T
j
=
25
°
C
f
=
10Hz to 100kHz
V
I
=
21 to 31V, I
O
=
40mA, f
=
120Hz
T
j
=
25
°
C
T
j
=
25
°
C, V
I
=
35V
I
O
=
5mA, T
j
=
0 to 125
°
C
mV
mA
2
I
Bias
mA
mA
μ
V
150
V
no
RR
dB
1
0.1
170
85
3.5
36
17.3
17.1
V
1.7
mA
140
1.5
15
46
T
j
=
25
°
C
Note 1) The specified condition T
j
=
25
°
C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
27V, I
O
=
40mA, C
I
=
0.33
μ
F, C
O
=
0.1
μ
F, T
j
=
0 to 125
°
C (AN78L18) and T
j
=
0 to 100
°
C
(AN78L18M)
mV/
°
C
I
Bias(IN)
I
Bias(L)
V
DIF(min)
I
O(Short)
V
O
/T
a
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
Bias current fluctuation to input
V
O
V
O
20.8
21
V
V
20
V
I
=
22.5 to 35V, I
O
=
1 to 70mA
V
I
=
22.5 to 35V, T
j
=
25
°
C
V
I
=
23 to 35V, T
j
=
25
°
C
REG
IN
300
250
mV
mV
50
40
REG
L
mV
35
I
O
=
1 to 100mA, T
j
=
25
°
C
I
O
=
1 to 40mA, T
j
=
25
°
C
T
j
=
25
°
C
V
I
=
23 to 35V, T
j
=
25
°
C
I
O
=
1 to 40mA, T
j
=
25
°
C
f
=
10Hz to 100kHz
V
I
=
23 to 33V, I
O
=
40mA, f
=
120Hz
T
j
=
25
°
C
T
j
=
25
°
C, V
I
=
35V
I
O
=
5mA, T
j
=
0 to 125
°
C
mV
mA
2
I
Bias
mA
mA
μ
V
170
V
no
RR
dB
1
0.1
180
90
3.5
34
19.2
19
V
1.7
mA
140
1.7
17
44
T
j
=
25
°
C
Note 1) The specified condition T
j
=
25
°
C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
29V, I
O
=
40mA, C
I
=
0.33
μ
F, C
O
=
0.1
μ
F, T
j
=
0 to 125
°
C (AN78L20) and T
j
=
0 to 100
°
C
(AN78L20M)
mV/
°
C
I
Bias(IN)
I
Bias(L)
V
DIF(min)
I
O(Short)
V
O
/T
a
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
Bias current fluctuation to input
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