參數(shù)資料
型號(hào): AN78LxxM
廠商: Panasonic Corporation
元件分類: 圓形連接器
英文描述: Circular Connector Shell; MIL SPEC:MIL-C-5015 A/B/C; Body Material:Aluminum Alloy; Series:97-3100; Connector Shell Size:22; Connecting Termination:Solder; Circular Shell Style:Wall Mount Receptacle; Gender:Male-Female Adapter
中文描述: 3針正輸出電壓調(diào)節(jié)器(100毫安型)
文件頁數(shù): 4/12頁
文件大小: 179K
代理商: AN78LXXM
AN78Lxx/AN78LxxM Series
4
SFF00005CEB
I
Electrical Characteristics at T
a
=
25
°
C (continued)
AN78L07, AN78L07M (7V type)
AN78L08, AN78L08M (8V type)
V
O
V
O
7.28
7.35
V
V
7
T
j
=
25
°
C
V
I
=
9.5 to 22V, I
O
=
1 to 70mA
V
I
=
9.5 to 22V, T
j
=
25
°
C
V
I
=
10 to 22V, T
j
=
25
°
C
REG
IN
165
115
mV
mV
70
60
REG
L
mV
13
I
O
=
1 to 100mA, T
j
=
25
°
C
I
O
=
1 to 40mA, T
j
=
25
°
C
T
j
=
25
°
C
V
I
=
10 to 22V, T
j
=
25
°
C
I
O
=
1 to 40mA, T
j
=
25
°
C
f
=
10Hz to 100kHz
V
I
=
10 to 20V, I
O
=
40mA, f
=
120Hz
T
j
=
25
°
C
T
j
=
25
°
C, V
I
=
35V
I
O
=
5mA, T
j
=
0 to 125
°
C
mV
mA
2
Note 1) The specified condition T
=
25
°
C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
12V, I
O
=
40mA, C
I
=
0.33
μ
F, C
O
=
0.1
μ
F, T
j
=
0 to 125
°
C (AN78L07) and T
j
=
0 to 100
°
C
(AN78L07M)
I
Bias
mA
I
Bias(IN)
I
Bias(L)
V
no
RR
mA
μ
V
dB
50
1
0.1
75
35
3
45
6.72
6.65
V
1.7
V
DIF(min)
I
O(Short)
V
O
/T
a
mA
140
mV/
°
C
0.75
6
55
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
Bias current fluctuation to input
V
O
V
O
8.3
8.4
V
V
8
T
j
=
25
°
C
V
I
=
10.5 to 23V, I
O
=
1 to 70mA
V
I
=
10.5 to 23V, T
j
=
25
°
C
V
I
=
11 to 23V, T
j
=
25
°
C
REG
IN
175
125
mV
mV
80
70
REG
L
mV
15
I
O
=
1 to 100mA, T
j
=
25
°
C
I
O
=
1 to 40mA, T
j
=
25
°
C
T
j
=
25
°
C
V
I
=
11 to 23V, T
j
=
25
°
C
I
O
=
1 to 40mA, T
j
=
25
°
C
f
=
10Hz to 100kHz
V
I
=
11 to 21V, I
O
=
40mA, f
=
120Hz
T
j
=
25
°
C
T
j
=
25
°
C, V
I
=
35V
I
O
=
5mA, T
j
=
0 to 125
°
C
mV
mA
2
Note 1) The specified condition T
=
25
°
C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
14V, I
O
=
40mA, C
I
=
0.33
μ
F, C
O
=
0.1
μ
F, T
j
=
0 to 125
°
C (AN78L08) and T
j
=
0 to 100
°
C
(AN78L08M)
I
Bias
mA
I
Bias(IN)
I
Bias(L)
V
no
RR
mA
μ
V
dB
60
1
0.1
80
40
3
44
7.7
7.6
V
1.7
V
DIF(min)
I
O(Short)
V
O
/T
a
mA
140
0.8
mV/
°
C
7
54
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
Bias current fluctuation to input
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