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參數(shù)資料
| 型號： | AN-04 |
| 英文描述： | SONET OC-3 Jitter Measurement |
| 中文描述： | 與SONET OC - 3抖動測量 |
| 文件頁數(shù)： | 2/4頁 |
| 文件大?。?/td> | 46K |
| 代理商： | AN-04 |
APPLICATION NOTE
AN-04
2
Micrel
JITTER GENERATION (Continued)
Figure 2
Test Setup for Measuring Jitter Generation
on the SY69743
Measuring Jitter Generation on the SY69743
Jitter Generation is measured on the TCLK1-4 outputs from
the device. These outputs are differential ECL signals at the
51.84MH/155.52MHz rate that is synthesized from the
reference clock input of 12.96MHz or 19.44MHz.
Measuring Jitter Generation on the SY69952
Jitter Generation is measured on the TCLK outputs from
the device. These outputs are differential ECL signals at the
51.84MHz/155.52MHz rate that is synthesized from the
reference clock inputs of 6.84MHz or 19.44MHz.
HP83752A
Synthesized Sweeper
HP 11801B Digital
Oscilloscope
SY69743
51.84MHz/
155.52MHz
TCLK
12.96MHz
or
19.44MHz
Transmit
{
TCLK1–4
HP70841B
HP3325B
Synthesizer
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| AN-05 | SY69952 in an OC-3 Transmission System |
| AN-06 | SY89429A Frequency Synthesis |
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| AN-16 | TOPSwitch Flyback Design Methodology |
| AN-17 | Flyback Transformer Design for TOPSwitch Power Supplies |
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