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參數(shù)資料
| 型號： | ADT50 |
| 廠商： | Analog Devices, Inc. |
| 元件分類： | 溫度/濕度傳感器 |
| 英文描述： | Low Voltage SOT-23 Temperature Sensors(低壓溫度傳感器) |
| 中文描述： | 低壓SOT - 23封裝溫度傳感器（低壓溫度傳感器） |
| 文件頁數(shù)： | 12/12頁 |
| 文件大小： | 168K |
| 代理商： | ADT50 |
ADT45/ADT50
–12–
REV. 0
OUT LINE DIME NSIONS
Dimensions shown in inches and (mm).
3-Lead Plastic Surface Mount Package
RT -3 (SOT -23)
C
P
0.1200 (3.048)
0.1102 (2.799)
PIN 1
0.0550 (1.397)
0.0470 (1.194)
0.0236 (0.599)
0.0177 (0.450)
0.1040 (2.642)
0.0827 (2.101)
0.0413 (1.049)
0.0374 (0.950)
0.0807 (2.050)
0.0701 (1.781)
1
2
3
SEATING
PLANE
0.0440 (1.118)
0.0320 (0.813)
0.0040 (0.102)
0.0005 (0.013)
0.0210 (0.533)
0.0146 (0.371)
0.027 (0.686)
REF
0.0059 (0.150)
0.0034 (0.086)
0.0100 (0.254)
0.0050 (0.127)
As a result of this operation, the lifetime of an integrated circuit
is significantly accelerated due to the increase in rates of reac-
tion within the semiconductor material. A well-understood, and
universal, model used by the semiconductor industry is the
Arrhenius model, which relates the change in rates of reaction
to a change in elevated temperatures. From the Arrhenius model,
an acceleration factor can be calculated and applied to the
specified parameter. For example, this acceleration factor can
be used to reduce a temperature sensor’s long-term stability
(e.g., 0.4
°
C after 1000 hours at T
J
= +150
°
C) to an observed
shift in that parameter at +25
°
C. For any semiconductor de-
vice, the acceleration factor is expressed as:
F
=
exp
E
a
k
×
1
T
1
±
1
T
2
where
F
= Calculated acceleration factor;
E
a
= Activation energy in eV = 0.7 eV;
k
= Boltzmann’s constant = 8.63
×
10
–5
eV/K ;
T
1 = T est temperature in K elvin, T
J
= +150
°
C = 423.15K ;
and
T
2 = Desired operating temperature in K elvin,
T
J
= +25
°
C = 298.15K
For example, if the desired operating temperature of an IC is
+25
°
C and has been subjected to test temperature of +150
°
C,
the acceleration factor is:
F
= 3.23
×
10
–4
With this background information, the ADT 45/ADT 50’s long-
term stability can be mapped to what its equivalent observed
shift would be at T
A
= +25
°
C. As quoted in the data sheet, the
long-term stability of these temperature sensors after 1000 hours
at +150
°
C is 0.4
°
C. T his shift is equivalent to 0.01
°
C/day at
T
J
= +150
°
C. T o determine what the observed shift would be at
T
A
= +25
°
C is a matter of applying the acceleration factor calcu-
lated above to this result:
0.01
°
C/day
×
3.23
×
10
–4
= 0.003
m
°
C/day
@
+25
°
C
T hus, if any of the ADT 45/ADT 50 devices were to be used at
25
°
C, then the observed shift would be no more than 0.003 m
°
C
per day, or 0.1 m
°
C per month. Calculating the observed shift
for any other operating temperature is simply a matter of calcu-
lating a new acceleration factor.
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