參數(shù)資料
型號(hào): ADS8402IPFBR
英文描述: 16-BIT, 1.25 MSPS, UNIPOLAR DIFFERENTIAL INPUT, MICRO POWER SAMPLING ANALOG-TO-DIGITAL CONVERTER WITH PARALLEL INTERFACE AND REFERENCE
中文描述: 16位,1.25 MSPS的,單極差動(dòng)輸入,微功耗采樣模數(shù)位并行接口和參考轉(zhuǎn)爐
文件頁(yè)數(shù): 2/25頁(yè)
文件大小: 212K
代理商: ADS8402IPFBR
ADS8402
SLAS154B
DECEMBER 2002
REVISED MAY 2003
www.ti.com
2
These devices have imited built-in ESD protection. The eads should be shorted together or the device placed n conductive foam during
storage or handling to prevent electrostatic damage to the MOS gates.
ORDERING INFORMATION
MODEL
MAXIMUM
INTEGRAL
LINEARITY
(LSB)
MAXIMUM
DIFFERENTIAL
LINEARITY
(LSB)
NO
MISSING
CODES
RESOLU-
TION (BIT)
PACKAGE
TYPE
PACKAGE
DESIGNATOR
TEMPER-
ATURE
RANGE
ORDERING
INFORMATION
TRANS-
PORT
MEDIA
QUANTITY
ADS8402I
±
6
15
48 Pin
TQFP
PFB
40 C to
85
°
C
ADS8402IPFBT
Tape and
reel 250
2~+3
ADS8402IPFBR
Tape and
reel 1000
ADS8402IB
3 5
±
3.5
16
48 Pin
TQFP
PFB
40 C to
85
°
C
ADS8402IBPFBT
Tape and
reel 250
1~+2
ADS8402IBPFBR
Tape and
reel 1000
NOTE:For the most current specifications and package information, refer to our website at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted(1)
UNIT
Voltage
+IN to AGND
+VA + 0.1 V
IN to AGND
+VA + 0.1 V
+VA to AGND
0.3 V to 7 V
Voltage range
+VBD to BDGND
0.3 V to 7 V
+VA to +VBD
0.3 V to 2.5 V
Digital input voltage to BDGND
0.3 V to +VBD + 0.3 V
Digital output voltage to BDGND
0.3 V to +VBD + 0.3 V
40
°
C to 85
°
C
65
°
C to 150
°
C
150
°
C
(TJMax
TA)/
θ
JA
86
°
C/W
215
°
C
220
°
C
Operating free-air temperature range, TA
Storage temperature range, Tstg
Junction temperature (TJ max)
TQFPpackage
TQFP package
Power dissipation
θ
JA thermal impedance
Leadtemperature soldering
Lead temperature, soldering
Vapor phase (60 sec)
Infrared (15 sec)
(1)Stresses beyond those listed under
absolute maximum ratings
may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under
recommended operating conditions
is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
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