參數(shù)資料
型號(hào)： AD9633BCPZRL7-105
廠商： Analog Devices Inc
文件頁(yè)數(shù)： 24/40頁(yè)
文件大?。?/td> 0K
描述： IC ADC 12BIT SRL 105MSPS 48LFCSP
標(biāo)準(zhǔn)包裝： 750
位數(shù)： 12
采樣率（每秒）： 105M
數(shù)據(jù)接口： LVDS，串行，SPI?
轉(zhuǎn)換器數(shù)目： 4
功率耗散（最大）： 473mW
電壓電源： 模擬和數(shù)字
工作溫度： -40°C ~ 85°C
安裝類(lèi)型： 表面貼裝
封裝/外殼： 48-WFQFN 裸露焊盤(pán)，CSP
供應(yīng)商設(shè)備封裝： 48-LFCSP-WQ（7x7）
包裝： 帶卷 (TR)
輸入數(shù)目和類(lèi)型： 4 個(gè)差分，雙極
AD9633
Data Sheet
Rev. 0 | Page 30 of 40
Consult the Memory Map section for information on how to
change these additional digital output timing features through
the SPI.
SDIO/OLM Pin
For applications that do not require SPI mode operation, the
CSB pin is tied to AVDD, and the SDIO/OLM pin controls the
output lane mode according to Table 13.
For applications where this pin is not used, CSB should be
tied to AVDD. When using the one-lane mode, the encode
rate should be ≤83.33 MSPS to meet the maximum output rate
of 1 Gbps.
Table 13. Output Lane Mode Pin Settings
OLM Pin
Voltage
Output Mode
AVDD (Default)
Two-lane. 1× frame, 12-bit serial output
GND
One-lane. 1× frame, 12-bit serial output
SCLK/DTP Pin
The SCLK/DTP pin is for use in applications that do not require
SPI mode operation. This pin can enable a single digital test
pattern if it and the CSB pin are held high during device power-
up. When SCLK/DTP is tied to AVDD, the ADC channel
outputs shift out the following pattern: 1000 0000 0000. The
FCO and DCO function normally while all channels shift out the
repeatable test pattern. This pattern allows the user to perform
timing alignment adjustments among the FCO, DCO, and
output data. This pin has an internal 10 kΩ resistor to GND. It
can be left unconnected.
Table 14. Digital Test Pattern Pin Settings
Selected DTP
DTP Voltage
Resulting
D0±x and D1±x
Normal Operation
10 kΩ to AGND
Normal operation
DTP
AVDD
1000 0000 0000
Additional and custom test patterns can also be observed when
commanded from the SPI port. Consult the Memory Map
section for information about the options available.
CSB Pin
The CSB pin should be tied to AVDD for applications that do
not require SPI mode operation. By tying CSB high, all SCLK
and SDIO information is ignored.
RBIAS Pin
To set the internal core bias current of the ADC, place a
10.0 kΩ, 1% tolerance resistor to ground at the RBIAS pin.
OUTPUT TEST MODES
The output test options are described in Table 11 and controlled
by the output test mode bits at Address 0x0D. When an output
test mode is enabled, the analog section of the ADC is discon-
nected from the digital back-end blocks and the test pattern is
run through the output formatting block. Some of the test patterns
are subject to output formatting, and some are not. The PN
generators from the PN sequence tests can be reset by setting
Bit 4 or Bit 5 of Register 0x0D. These tests can be performed
with or without an analog signal (if present, the analog signal is
ignored), but they do require an encode clock. For more
information, see the AN-877 Application Note, Interfacing to
High Speed ADCs via SPI.
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AD9634-210EBZ 功能描述:數(shù)據(jù)轉(zhuǎn)換 IC 開(kāi)發(fā)工具 12 Bit 210 Msps ADC RoHS:否 制造商:Texas Instruments 產(chǎn)品:Demonstration Kits 類(lèi)型:ADC 工具用于評(píng)估:ADS130E08 接口類(lèi)型:SPI 工作電源電壓:- 6 V to + 6 V
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