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| 型號： | AD774B |
| 廠商： | Analog Devices, Inc. |
| 元件分類： | 串行ADC |
| 英文描述： | Complete 12-Bit A/D Converters(完備的12位A/D轉(zhuǎn)換器) |
| 中文描述： | 完整的12位A / D轉(zhuǎn)換器（完備的12位的A / D轉(zhuǎn)換器） |
| 文件頁數(shù)： | 5/12頁 |
| 文件大?。?/td> | 335K |
| 代理商： | AD774B |
AD674B/AD774B
REV. B
–5–
TIMING—STAND-ALONE MODE (Figures 4a and 4b)
J, K, A, B Grades T Grade
Symbol
Min Typ Max
Parameter
Min Typ Max Units
Data Access Time
Low R/
C
Pulse Width
STS Delay from R/
C
Data Valid After R/
C
Low
STS Delay After Data Valid t
HS
High R/
C
Pulse Width
t
DDR
t
HRL
t
DS
t
HDR
150
150
ns
ns
ns
ns
ns
ns
50
50
200
225
25
30
150
25
30
150
200
600
200 600
t
HRH
Specifications subject to change without notice.
ABSOLUTE MAXIMUM RATINGS*
V
CC
to Digital Common . . . . . . . . . . . . . . . . . . . 0 to +16.5 V
V
EE
to Digital Common . . . . . . . . . . . . . . . . . . . . . 0 to –16.5 V
V
LOGIC
to Digital Common . . . . . . . . . . . . . . . . . . . . 0 to +7 V
Analog Common to Digital Common . . . . . . . . . . . . . . .
±
1 V
Digital Inputs to Digital Common . . . –0.5 V to V
LOGIC
+0.5 V
Analog Inputs to Analog Common . . . . . . . . . . . . . V
EE
to V
CC
20 V
IN
to Analog Common . . . . . . . . . . . . . . . . . . . . . .
±
24 V
REF OUT . . . . . . . . . . . . . . . . . . Indefinite Short to Common
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Momentary Short to V
CC
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . +175
°
C
Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . .825 mW
Lead Temperature, Soldering . . . . . . . . . . . . . . 300
°
C, 10 sec
Storage Temperature . . . . . . . . . . . . . . . . . . .–65
°
C to +150
°
C
*Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in the
operational section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
DATA
VALID
DATA VALID
HIGH-Z
t
HS
t
HDR
DS
t
t
DS
t
C
t
HRL
STS
R/C
DB11_
Flgure 4a. Stand-Alone Mode Timing Low Pulse R/
C
DATA
VALID
STS
HIGH-Z
HIGH-Z
t
C
t
DS
t
HRH
t
DDR
t
HDR
t
HL
R/C
DB11_
Figure 4b. Stand-Alone Mode Timing High Pulse for R/
C
WARNING!
ESD SENSITIVE DEVICE
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although
the AD674B/AD774B features proprietary ESD protection circuitry, permanent damage may occur
on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are
recommended to avoid performance degradation or loss of functionality.
ORDERING GUIDE
Conversion
Time (max)
INL
(T
MIN
to T
MAX
)
Package
Description
Package
Option
2
Model
l
Temperature
AD674BJN
AD674BKN
AD674BJR
AD674BKR
AD674BAD
AD674BBD
AD674BTD
AD774BJN
AD774BKN
AD774BJR
AD774BKR
AD774BAD
AD774BBD
AD774BTD
0
°
C to +70
°
C
0
°
C to +70
°
C
0
°
C to +70
°
C
0
°
C to +70
°
C
–40
°
C to +85
°
C
–40
°
C to +85
°
C
–55
°
C to +125
°
C
0
°
C to +70
°
C
0
°
C to +70
°
C
0
°
C to +70
°
C
0
°
C to +70
°
C
–40
°
C to +85
°
C
–40
°
C to +85
°
C
–55
°
C to +125
°
C
15
μ
s
15
μ
s
15
μ
s
15
μ
s
15
μ
s
15
μ
s
15
μ
s
8
μ
s
8
μ
s
15
μ
s
15
μ
s
8
μ
s
8
μ
s
8
μ
s
±
1 LSB
±
1/2 LSB
±
1 LSB
±
1/2 LSB
±
1 LSB
±
1/2 LSB
±
1 LSB
±
1 LSB
±
1/2 LSB
±
1 LSB
±
1/2 LSB
±
1 LSB
±
1/2 LSB
±
1 LSB
Plastic DIP
Plastic DIP
Plastic SOIC
Plastic SOIC
Ceramic DIP
Ceramic DIP
Ceramic DIP
Plastic DIP
Plastic DIP
Plastic SOIC
Plastic SOIC
Ceramic DIP
Ceramic DIP
Ceramic DIP
N-28
N-28
R-28
R-28
D-28
D-28
D-28
N-28
N-28
R-28
R-28
D-28
D-28
D-28
NOTES
1
For details on grade and package offerings screened in accordance with MIL-STD-883, refer to the Analog Devices Military
Products Databook or current AD674B/ AD774B/883B data sheet.
2
N = Plastic DIP; D = Hermetic DIP; R = Plastic SOIC.
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參數(shù)描述 |
|---|---|
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