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| 型號： | AD5744RCSUZ |
| 廠商： | ANALOG DEVICES INC |
| 元件分類： | DAC |
| 英文描述： | Complete Quad, 14-Bit, High Accuracy, Serial Input, Bipolar Voltage Output DAC |
| 中文描述： | SERIAL INPUT LOADING, 8 us SETTLING TIME, 14-BIT DAC, PQFP32 |
| 封裝： | ROHS COMPLIANT, PLASTIC, MS-026ABA, TQFP-32 |
| 文件頁數(shù)： | 10/32頁 |
| 文件大小： | 489K |
| 代理商： | AD5744RCSUZ |
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AD5744R
Preliminary Technical Data
ABSOLUTE MAXIMUM RATINGS
T
A
= 25°C unless otherwise noted. Transient currents of up to
100 mA do not cause SCR latch-up.
Table 4.
Parameter
AV
DD
to AGND, DGND
AV
SS
to AGND, DGND
DV
CC
to DGND
Digital Inputs to DGND
Rev. PrA | Page 10 of 32
Rating
0.3 V to +17 V
+0.3 V to 17 V
0.3 V to +7 V
0.3 V to DV
CC
+ 0.3 V or 7 V
(whichever is less)
0.3 V to DV
CC
+ 0.3 V
0.3 V to AV
DD
+ 0.3V
AV
SS
to AV
DD
AV
SS
to AV
DD
AV
SS
to AV
DD
Digital Outputs to DGND
REFIN to AGND, PGND
REFOUT to AGND
TEMP
VOUTA, VOUTB, VOUTC, VOUTD to
AGND
AGND to DGND
Operating Temperature Range
Industrial
Storage Temperature Range
Junction Temperature (T
J
max)
32-Lead TQFP
θ
JA
Thermal Impedance
θ
JC
Thermal Impedance
Reflow Soldering
Peak Temperature
Time at Peak Temperature
0.3 V to +0.3 V
40°C to +85°C
65°C to +150°C
150°C
65°C/W
12°C/W
220°C
10 sec to 40 sec
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
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