
REV. 0
AD5544/AD5554
–5–
AD5554 ELECTRICAL CHARACTERISTICS
Parameter
AC CHARACTERISTICS
1
Output Voltage Settling Time t
S
Symbol
Condition
Min Typ Max
Unit
To
±
0.1% of Full Scale, Data = 0000
H
to 3FFF
H
to 0000
H
To
±
0.0015% of Full Scale, Data = 0000
H
to 3FFF
H
to 0000
H
V
REF
X = 100 mV rms, Data = 3FFF
H
, C
FB
= 15 pF
V
REF
X = 10 V, Data 0000
H
to 2000
H
to 0000
H
V
OUT
X/V
REF
X Data = 0000
H
, V
REF
X = 100 mV rms, f = 100 kHz
V
OUT
A/V
REF
B Data = 0000
H
, V
REF
B = 100 mV rms,
Adjacent Channel, f = 100 kHz
Q
CS
= 1, and f
CLK
= 1 MHz
THD
V
REF
= 5 V p-p, Data = 3FFF
H
, f = 1 kHz
e
N
f = 1 kHz, BW = 1 Hz
1
μ
s
Output Voltage Settling Time t
S
2
μ
s
Reference Multiplying BW
DAC Glitch Impulse
Feedthrough Error
Crosstalk Error
BW –3 dB
Q
2
1.2
–65
MHz
nV-s
dB
–90
5
–90
7
dB
nV-s
dB
nV/
√
Hz
Digital Feedthrough
Total Harmonic Distortion
Output Spot Noise Voltage
NOTES:
1
All ac characteristic tests are performed in a closed-loop system using an OP42 I-to-V converter amplifier.
Specifications subject to change without notice.
(@ V
DD
= 5 V 10%, V
SS
= –300 mV, I
OUT
X = Virtual GND, A
GND
X = 0 V, V
REF
A,
B, C, D = 10 V, T
A
= full operating temperature range, unless otherwise
noted.)
ABSOLUTE MAXIMUM RATINGS
*
V
DD
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, +8 V
V
SS
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V, –7 V
V
REF
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . –18 V, +18 V
Logic Inputs and Output to GND . . . . . . . . . . . . –0.3 V, +8 V
V(I
OUT
) to GND . . . . . . . . . . . . . . . . . . . .–0.3 V, V
DD
+ 0.3 V
A
GND
X to DGND . . . . . . . . . . . . . . . . . . . . . . –0.3 V, + 0.3 V
Input Current to Any Pin Except Supplies . . . . . . . . .
±
50 mA
Package Power Dissipation . . . . . . . . . . . . (T
J
MAX – T
A
)/
θ
JA
Thermal Resistance
θ
JA
28-Lead Shrink Surface-Mount (RS-28) . . . . . . . . 100
°
C/W
Maximum Junction Temperature (T
J
MAX) . . . . . . . . . 150
°
C
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although
the AD5544/AD5554 features proprietary ESD protection circuitry, permanent damage may occur
on devices subjected to high-energy electrostatic discharges. Therefore, proper ESD precautions
are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
ORDERING GUIDE
RES
Bit
INL
LSB
±
4
±
1
DNL
LSB
±
1.5
±
1
Temperature
Range
–40/+85
°
C
–40/+85
°
C
Package
Description
Package
Option
Model
AD5544ARS
AD5554BRS
16
14
SSOP-28
SSOP-28
RS-28
RS-28
The AD5544/AD5554 contain 4196 transistors. The die size is 122 mil
×
204 mil.
Operating Temperature Range
Model A . . . . . . . . . . . . . . . . . . . . . . . . . . . –40
°
C to +85
°
C
Storage Temperature Range . . . . . . . . . . . . . –65
°
C to +150
°
C
Lead Temperature:
RS-28 (Vapor Phase, 60 secs) . . . . . . . . . . . . . . . . . . 215
°
C
RS-28 (Infrared, 15 secs) . . . . . . . . . . . . . . . . . . . . . . 220
°
C
*
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.