VDD = 2.5 V to 5.5 V, R
參數(shù)資料
型號(hào): AD5327BRUZ
廠商: Analog Devices Inc
文件頁(yè)數(shù): 24/28頁(yè)
文件大?。?/td> 0K
描述: IC DAC 12BIT QUAD 2.5V 16-TSSOP
產(chǎn)品培訓(xùn)模塊: Data Converter Fundamentals
DAC Architectures
標(biāo)準(zhǔn)包裝: 1
設(shè)置時(shí)間: 8µs
位數(shù): 12
數(shù)據(jù)接口: DSP,MICROWIRE?,QSPI?,串行,SPI?
轉(zhuǎn)換器數(shù)目: 4
電壓電源: 單電源
功率耗散(最大): 4.5mW
工作溫度: -40°C ~ 105°C
安裝類(lèi)型: 表面貼裝
封裝/外殼: 16-TSSOP(0.173",4.40mm 寬)
供應(yīng)商設(shè)備封裝: 16-TSSOP
包裝: 管件
輸出數(shù)目和類(lèi)型: 4 電壓,單極;4 電壓,雙極
采樣率(每秒): 125k
產(chǎn)品目錄頁(yè)面: 782 (CN2011-ZH PDF)
AD5307/AD5317/AD5327
Rev. C | Page 5 of 28
AC CHARACTERISTICS
VDD = 2.5 V to 5.5 V, RL = 2 kΩ to GND, CL = 200 pF to GND. All specifications TMIN to TMAX, unless otherwise noted.
Table 2.
A, B Versions1
Parameter2, 3
Min
Typ
Max
Unit
Conditions/Comments
Output Voltage Settling Time
VREF = VDD = 5 V
AD5307
6
8
μs
1/4 scale to 3/4 scale change (0x40 to 0xC0)
AD5317
7
9
μs
1/4 scale to 3/4 scale change (0x100 to 0x300)
AD5327
8
10
μs
1/4 scale to 3/4 scale change (0x400 to 0xC00)
Slew Rate
0.7
V/μs
Major-Code Change Glitch Energy
12
nV-s
1 LSB change around major carry
Digital Feedthrough
0.5
nV-s
SDO Feedthrough
4
nV-s
Daisy-chain mode; SDO load is 10 pF
Digital Crosstalk
0.5
nV-s
Analog Crosstalk
1
nV-s
DAC-to-DAC Crosstalk
3
nV-s
Multiplying Bandwidth
200
kHz
VREF = 2 V ± 0.1 V p-p; unbuffered mode
Total Harmonic Distortion
70
dB
VREF = 2.5 V ± 0.1 V p-p; frequency = 10 kHz
1 Temperature range (A, B versions): 40°C to +105°C; typical at +25°C.
2 Guaranteed by design and characterization; not production tested.
3 See the Terminology section.
TIMING CHARACTERISTICS
VDD = 2.5 V to 5.5 V; all specifications TMIN to TMAX, unless otherwise noted.
Table 3.
A, B Versions
Parameter1, ,
Limit at TMIN, TMAX
Unit
Conditions/Comments
t1
33
ns min
SCLK cycle time
t2
13
ns min
SCLK high time
t3
13
ns min
SCLK low time
t4
13
ns min
SYNC to SCLK falling edge set-up time
t5
5
ns min
Data set-up time
t6
4.5
ns min
Data hold time
t7
5
ns min
SCLK falling edge to SYNC rising edge
t8
50
ns min
Minimum SYNC high time
t9
20
ns min
LDAC pulse width
t10
20
ns min
SCLK falling edge to LDAC rising edge
t11
20
ns min
CLR pulse width
t12
0
ns min
SCLK falling edge to LDAC falling edge
t134, 5
20
ns max
SCLK rising edge to SDO valid (VDD = 3.6 V to 5.5 V)
25
ns max
SCLK rising edge to SDO valid (VDD = 2.5 V to 3.5 V)
t14
5
ns min
SCLK falling edge to SYNC rising edge
t15
8
ns min
SYNC rising edge to SCLK rising edge
t16
0
ns min
SYNC rising edge to LDAC falling edge
1 Guaranteed by design and characterization; not production tested.
2 All input signals are specified with tR = tF = 5 ns (10% to 90% of VDD) and timed from a voltage level of (VIL + VIH)/2.
3 See Figure 3 and Figure 4.
4 This is measured with the load circuit of Figure 2. t13 determines maximum SCLK frequency in daisy-chain mode.
5 Daisy-chain mode only.
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