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參數(shù)資料
| 型號(hào)： | ABT22V10A7A |
| 廠(chǎng)商： | NXP SEMICONDUCTORS |
| 元件分類(lèi)： | PLD |
| 英文描述： | GT 6C 3#0 3#12 SKT PLUG RTANG |
| 中文描述： | OT PLD, 8 ns, PQCC28 |
| 文件頁(yè)數(shù)： | 4/18頁(yè) |
| 文件大?。?/td> | 302K |
| 代理商： | ABT22V10A7A |
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Philips Semiconductors
Product specification
ABT22V10A5, A7
5V high-speed universal PLD device
with live insertion capability
1996 Dec 16
4
DC ELECTRICAL CHARACTERISTICS
Over operating ranges.
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
UNIT
MIN
MAX
Input voltage
V
IL
Low
V
CC
= MIN
0.8
V
V
IH
High
V
CC
= MAX
2.0
V
V
I
Clamp
V
CC
= MIN, I
IN
= –18mA
–1.2
V
Output voltage
V
OH
High-level output voltage
V
I
IH
or V
IL
I
OH
= –32mA
2.0
V
V
CC
= MIN
I
OH
= –16mA
2.4
V
V
OL
Low-level output voltage
V
CC
= MIN
V
I
IH
or V
IL
I
OL
= 48mA
0.5
V
Input current
I
IL
Low
V
CC
= MAX, V
IN
= 0.4V
–10
μ
A
I
IH
High
V
CC
= MAX, V
IN
= 2.7V
10
μ
A
I
I
Max input current
V
CC
= MAX, V
IN
= 5.5V
20
μ
A
Output current
I
PU/PD
Power-up/down 3-State
output current
4
V
CC
<2.1V; V
O
= 0.5V to V
;
V
I
CC
; OE/OE = X
50
μ
A
V
CC
= MAX
I
OZH
Output leakage
2
V
IN
= V
IL
or V
IH
, V
OUT
= 2.7V
20
μ
A
I
OZL
Output leakage
2
V
IN
= V
IL
or V
IH
, V
OUT
=0.4V
–20
μ
A
I
SC
Short circuit
3
V
OUT
= 0.5V
–30
–220
mA
I
CC
V
CC
supply current
V
CC
= MAX, Outputs enabled, V
I
= V
CC
or GND; I
O
= 0
200
mA
Ground Bounce
TYP
MAX
UNIT
V
OLP
Minimum dynamic V
OH5
V
= MAX, 25
°
C
C
L
= 50pF (including jig capacitance)
1.0
1.2
V
NOTES:
1. These are absolute values with respect to device ground and all overshoots due to system or tester noise are included.
2. I/O pin leakage is the worst case of I
or I
(where X = H or L).
3. No more than one output should be tested at a time. Duration of the short-circuit test should not exceed one second. V
OUT
= 0.5V has been
chosen to avoid test problems caused by tester ground degradation.
4. This parameter is valid for any V
CC
between 0V and 1.2 V with a transition time up to 10 mS. From V
CC
= 1.2 to V
CC
= 5.0V
±
0.25V a
transition time of 100
μ
S is permitted. X = Don’t care.
5. Guaranteed by design, but not tested. Measured holding one output (the output under test) Low and simultaneously switching all remianing
output from a High to a Low state. Switch S1 is closed; 50pF load.
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