參數(shù)資料
型號(hào): A40MX02-1PQG100
廠商: Microsemi SoC
文件頁(yè)數(shù): 51/142頁(yè)
文件大?。?/td> 0K
描述: IC FPGA MX SGL CHIP 3K 100-PQFP
標(biāo)準(zhǔn)包裝: 66
系列: MX
輸入/輸出數(shù): 57
門(mén)數(shù): 3000
電源電壓: 3 V ~ 3.6 V,4.75 V ~ 5.25 V
安裝類(lèi)型: 表面貼裝
工作溫度: 0°C ~ 70°C
封裝/外殼: 100-BQFP
供應(yīng)商設(shè)備封裝: 100-PQFP(14x20)
第1頁(yè)第2頁(yè)第3頁(yè)第4頁(yè)第5頁(yè)第6頁(yè)第7頁(yè)第8頁(yè)第9頁(yè)第10頁(yè)第11頁(yè)第12頁(yè)第13頁(yè)第14頁(yè)第15頁(yè)第16頁(yè)第17頁(yè)第18頁(yè)第19頁(yè)第20頁(yè)第21頁(yè)第22頁(yè)第23頁(yè)第24頁(yè)第25頁(yè)第26頁(yè)第27頁(yè)第28頁(yè)第29頁(yè)第30頁(yè)第31頁(yè)第32頁(yè)第33頁(yè)第34頁(yè)第35頁(yè)第36頁(yè)第37頁(yè)第38頁(yè)第39頁(yè)第40頁(yè)第41頁(yè)第42頁(yè)第43頁(yè)第44頁(yè)第45頁(yè)第46頁(yè)第47頁(yè)第48頁(yè)第49頁(yè)第50頁(yè)當(dāng)前第51頁(yè)第52頁(yè)第53頁(yè)第54頁(yè)第55頁(yè)第56頁(yè)第57頁(yè)第58頁(yè)第59頁(yè)第60頁(yè)第61頁(yè)第62頁(yè)第63頁(yè)第64頁(yè)第65頁(yè)第66頁(yè)第67頁(yè)第68頁(yè)第69頁(yè)第70頁(yè)第71頁(yè)第72頁(yè)第73頁(yè)第74頁(yè)第75頁(yè)第76頁(yè)第77頁(yè)第78頁(yè)第79頁(yè)第80頁(yè)第81頁(yè)第82頁(yè)第83頁(yè)第84頁(yè)第85頁(yè)第86頁(yè)第87頁(yè)第88頁(yè)第89頁(yè)第90頁(yè)第91頁(yè)第92頁(yè)第93頁(yè)第94頁(yè)第95頁(yè)第96頁(yè)第97頁(yè)第98頁(yè)第99頁(yè)第100頁(yè)第101頁(yè)第102頁(yè)第103頁(yè)第104頁(yè)第105頁(yè)第106頁(yè)第107頁(yè)第108頁(yè)第109頁(yè)第110頁(yè)第111頁(yè)第112頁(yè)第113頁(yè)第114頁(yè)第115頁(yè)第116頁(yè)第117頁(yè)第118頁(yè)第119頁(yè)第120頁(yè)第121頁(yè)第122頁(yè)第123頁(yè)第124頁(yè)第125頁(yè)第126頁(yè)第127頁(yè)第128頁(yè)第129頁(yè)第130頁(yè)第131頁(yè)第132頁(yè)第133頁(yè)第134頁(yè)第135頁(yè)第136頁(yè)第137頁(yè)第138頁(yè)第139頁(yè)第140頁(yè)第141頁(yè)第142頁(yè)
40MX and 42MX FPGA Families
1- 12
R e v i sio n 1 1
Test Circuitry and Silicon Explorer II Probe
MX devices contain probing circuitry that provides built-in access to every node in a design, via the use of
Silicon Explorer II. Silicon Explorer II is an integrated hardware and software solution that, in conjunction
with the Designer software, allow users to examine any of the internal nets of the device while it is
operating in a prototyping or a production system. The user can probe into an MX device without
changing the placement and routing of the design and without using any additional resources. Silicon
Explorer II's noninvasive method does not alter timing or loading effects, thus shortening the debug cycle
and providing a true representation of the device under actual functional situations.
Silicon Explorer II samples data at 100 MHz (asynchronous) or 66 MHz (synchronous). Silicon Explorer II
attaches to a PC's standard COM port, turning the PC into a fully functional 18-channel logic analyzer.
Silicon Explorer II allows designers to complete the design verification process at their desks and
reduces verification time from several hours per cycle to a few seconds.
Silicon Explorer II is used to control the MODE, DCLK, SDI and SDO pins in MX devices to select the
desired nets for debugging. The user simply assigns the selected internal nets in the Silicon Explorer II
software to the PRA/PRB output pins for observation. Probing functionality is activated when the MODE
pin is held HIGH.
Figure 1-11 illustrates the interconnection between Silicon Explorer II and 40MX devices, while Figure 1-
12 on page 1-12 illustrates the interconnection between Silicon Explorer II and 42MX devices
To allow for probing capabilities, the security fuses must not be programmed. (Refer to "User Security"
section on page 1-8 for the security fuses of 40MX and 42MX devices). Table 1-2 on page 1-13
summarizes the possible device configurations for probing.
PRA and PRB pins are dual-purpose pins. When the "Reserve Probe Pin" is checked in the
Designer software, PRA and PRB pins are reserved as dedicated outputs for probing. If PRA and PRB
pins are required as user I/Os to achieve successful layout and "Reserve Probe Pin" is checked, the
layout tool will override the option and place user I/Os on PRA and PRB pins.
Figure 1-11 Silicon Explorer II Setup with 40MX
Figure 1-12 Silicon Explorer II Setup with 42MX
40MX
Silicon
Explorer II
PRA
PRB
SDO
DCLK
SDI
MODE
Serial Connection
to Windows PC
16 Logic Analyzer Channels
42MX
Silicon
Explorer II
PRA
PRB
SDO
DCLK
SDI
MODE
Serial Connection
to Windows PC
16 Logic Analyzer Channels
相關(guān)PDF資料
PDF描述
A40MX02-PQG100I IC FPGA MX SGL CHIP 3K 100-PQFP
A40MX02-1PQ100 IC FPGA MX SGL CHIP 3K 100-PQFP
A40MX02-PQ100I IC FPGA MX SGL CHIP 3K 100-PQFP
A54SX08A-PQ208 IC FPGA SX 12K GATES 208-PQFP
EP4CE10F17I8L IC CYCLONE IV FPGA 10K 256FBGA
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
A40MX02-1PQG100I 功能描述:IC FPGA MX SGL CHIP 3K 100-PQFP RoHS:是 類(lèi)別:集成電路 (IC) >> 嵌入式 - FPGA(現(xiàn)場(chǎng)可編程門(mén)陣列) 系列:MX 標(biāo)準(zhǔn)包裝:90 系列:ProASIC3 LAB/CLB數(shù):- 邏輯元件/單元數(shù):- RAM 位總計(jì):36864 輸入/輸出數(shù):157 門(mén)數(shù):250000 電源電壓:1.425 V ~ 1.575 V 安裝類(lèi)型:表面貼裝 工作溫度:-40°C ~ 125°C 封裝/外殼:256-LBGA 供應(yīng)商設(shè)備封裝:256-FPBGA(17x17)
A40MX02-1PQG100M 制造商:Microsemi Corporation 功能描述:FPGA 3K GATES 295 CELLS 96MHZ/160MHZ 0.45UM 3.3V/5V 100PQFP - Trays 制造商:Microsemi Corporation 功能描述:IC FPGA 57 I/O 100PQFP
A40MX02-1VQ80 功能描述:IC FPGA MX SGL CHIP 3K 80-VQFP RoHS:否 類(lèi)別:集成電路 (IC) >> 嵌入式 - FPGA(現(xiàn)場(chǎng)可編程門(mén)陣列) 系列:MX 標(biāo)準(zhǔn)包裝:90 系列:ProASIC3 LAB/CLB數(shù):- 邏輯元件/單元數(shù):- RAM 位總計(jì):36864 輸入/輸出數(shù):157 門(mén)數(shù):250000 電源電壓:1.425 V ~ 1.575 V 安裝類(lèi)型:表面貼裝 工作溫度:-40°C ~ 125°C 封裝/外殼:256-LBGA 供應(yīng)商設(shè)備封裝:256-FPBGA(17x17)
A40MX02-1VQ80I 功能描述:IC FPGA MX SGL CHIP 3K 80-VQFP RoHS:否 類(lèi)別:集成電路 (IC) >> 嵌入式 - FPGA(現(xiàn)場(chǎng)可編程門(mén)陣列) 系列:MX 標(biāo)準(zhǔn)包裝:90 系列:ProASIC3 LAB/CLB數(shù):- 邏輯元件/單元數(shù):- RAM 位總計(jì):36864 輸入/輸出數(shù):157 門(mén)數(shù):250000 電源電壓:1.425 V ~ 1.575 V 安裝類(lèi)型:表面貼裝 工作溫度:-40°C ~ 125°C 封裝/外殼:256-LBGA 供應(yīng)商設(shè)備封裝:256-FPBGA(17x17)
A40MX02-1VQ80M 制造商:Microsemi Corporation 功能描述:FPGA 3K GATES 295 CELLS 96MHZ/160MHZ 0.45UM 3.3V/5V 80VQFP - Trays 制造商:Microsemi Corporation 功能描述:IC FPGA 57 I/O 80VQFP