參數(shù)資料
型號(hào): A40MX02-1PQG100
廠(chǎng)商: Microsemi SoC
文件頁(yè)數(shù): 130/142頁(yè)
文件大小: 0K
描述: IC FPGA MX SGL CHIP 3K 100-PQFP
標(biāo)準(zhǔn)包裝: 66
系列: MX
輸入/輸出數(shù): 57
門(mén)數(shù): 3000
電源電壓: 3 V ~ 3.6 V,4.75 V ~ 5.25 V
安裝類(lèi)型: 表面貼裝
工作溫度: 0°C ~ 70°C
封裝/外殼: 100-BQFP
供應(yīng)商設(shè)備封裝: 100-PQFP(14x20)
第1頁(yè)第2頁(yè)第3頁(yè)第4頁(yè)第5頁(yè)第6頁(yè)第7頁(yè)第8頁(yè)第9頁(yè)第10頁(yè)第11頁(yè)第12頁(yè)第13頁(yè)第14頁(yè)第15頁(yè)第16頁(yè)第17頁(yè)第18頁(yè)第19頁(yè)第20頁(yè)第21頁(yè)第22頁(yè)第23頁(yè)第24頁(yè)第25頁(yè)第26頁(yè)第27頁(yè)第28頁(yè)第29頁(yè)第30頁(yè)第31頁(yè)第32頁(yè)第33頁(yè)第34頁(yè)第35頁(yè)第36頁(yè)第37頁(yè)第38頁(yè)第39頁(yè)第40頁(yè)第41頁(yè)第42頁(yè)第43頁(yè)第44頁(yè)第45頁(yè)第46頁(yè)第47頁(yè)第48頁(yè)第49頁(yè)第50頁(yè)第51頁(yè)第52頁(yè)第53頁(yè)第54頁(yè)第55頁(yè)第56頁(yè)第57頁(yè)第58頁(yè)第59頁(yè)第60頁(yè)第61頁(yè)第62頁(yè)第63頁(yè)第64頁(yè)第65頁(yè)第66頁(yè)第67頁(yè)第68頁(yè)第69頁(yè)第70頁(yè)第71頁(yè)第72頁(yè)第73頁(yè)第74頁(yè)第75頁(yè)第76頁(yè)第77頁(yè)第78頁(yè)第79頁(yè)第80頁(yè)第81頁(yè)第82頁(yè)第83頁(yè)第84頁(yè)第85頁(yè)第86頁(yè)第87頁(yè)第88頁(yè)第89頁(yè)第90頁(yè)第91頁(yè)第92頁(yè)第93頁(yè)第94頁(yè)第95頁(yè)第96頁(yè)第97頁(yè)第98頁(yè)第99頁(yè)第100頁(yè)第101頁(yè)第102頁(yè)第103頁(yè)第104頁(yè)第105頁(yè)第106頁(yè)第107頁(yè)第108頁(yè)第109頁(yè)第110頁(yè)第111頁(yè)第112頁(yè)第113頁(yè)第114頁(yè)第115頁(yè)第116頁(yè)第117頁(yè)第118頁(yè)第119頁(yè)第120頁(yè)第121頁(yè)第122頁(yè)第123頁(yè)第124頁(yè)第125頁(yè)第126頁(yè)第127頁(yè)第128頁(yè)第129頁(yè)當(dāng)前第130頁(yè)第131頁(yè)第132頁(yè)第133頁(yè)第134頁(yè)第135頁(yè)第136頁(yè)第137頁(yè)第138頁(yè)第139頁(yè)第140頁(yè)第141頁(yè)第142頁(yè)
40MX and 42MX FPGA Families
1- 84
R e v i sio n 1 1
SDI, I/O
Serial Data Input
Serial data input for diagnostic probe and device programming. SDI is active when the MODE pin is
HIGH. This pin functions as an I/O when the MODE pin is LOW.
SDO, I/O
Serial Data Output
Serial data output for diagnostic probe and device programming. SDO is active when the MODE pin is
HIGH. This pin functions as an I/O when the MODE pin is LOW. SDO is available for 42MX devices only.
When Silicon Explorer II is being used, SDO will act as an output while the "checksum" command is run.
It will return to user I/O when "checksum" is complete.
TCK, I/O
Test Clock
Clock signal to shift the Boundary Scan Test (BST) data into the device. This pin functions as an I/O
when "Reserve JTAG" is not checked in the Designer Software. BST pins are only available in A42MX24
and A42MX36 devices.
TDI, I/O
Test Data In
Serial data input for BST instructions and data. Data is shifted in on the rising edge of TCK. This pin
functions as an I/O when "Reserve JTAG" is not checked in the Designer Software. BST pins are only
available in A42MX24 and A42MX36 devices.
TDO, I/O
Test Data Out
Serial data output for BST instructions and test data. This pin functions as an I/O when "Reserve JTAG"
is not checked in the Designer Software. BST pins are only available in A42MX24 and A42MX36
devices.
TMS, I/O
Test Mode Select
The TMS pin controls the use of the IEEE 1149.1 Boundary Scan pins (TCK, TDI, TDO). In flexible mode
when the TMS pin is set LOW, the TCK, TDI and TDO pins are boundary scan pins. Once the boundary
scan pins are in test mode, they will remain in that mode until the internal boundary scan state machine
reaches the "logic reset" state. At this point, the boundary scan pins will be released and will function as
regular I/O pins. The "logic reset" state is reached 5 TCK cycles after the TMS pin is set HIGH. In
dedicated test mode, TMS functions as specified in the IEEE 1149.1 specifications. IEEE JTAG
specification recommends a 10k
Ω pull-up resistor on the pin. BST pins are only available in A42MX24
and A42MX36 devices.
VCC
Supply Voltage
Input supply voltage for 40MX devices
VCCA
Supply Voltage
Supply voltage for array in 42MX devices
VCCI
Supply Voltage
Supply voltage for I/Os in 42MX devices
WD, I/O
Wide Decode Output
When a wide decode module is used in a 42MX device this pin can be used as a dedicated output from
the wide decode module. This direct connection eliminates additional interconnect delays associated
with regular logic modules. To implement the direct I/O connection, connect an output buffer of any type
to the output of the wide decode macro and place this output on one of the reserved WD pins.
相關(guān)PDF資料
PDF描述
A40MX02-PQG100I IC FPGA MX SGL CHIP 3K 100-PQFP
A40MX02-1PQ100 IC FPGA MX SGL CHIP 3K 100-PQFP
A40MX02-PQ100I IC FPGA MX SGL CHIP 3K 100-PQFP
A54SX08A-PQ208 IC FPGA SX 12K GATES 208-PQFP
EP4CE10F17I8L IC CYCLONE IV FPGA 10K 256FBGA
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
A40MX02-1PQG100I 功能描述:IC FPGA MX SGL CHIP 3K 100-PQFP RoHS:是 類(lèi)別:集成電路 (IC) >> 嵌入式 - FPGA(現(xiàn)場(chǎng)可編程門(mén)陣列) 系列:MX 標(biāo)準(zhǔn)包裝:90 系列:ProASIC3 LAB/CLB數(shù):- 邏輯元件/單元數(shù):- RAM 位總計(jì):36864 輸入/輸出數(shù):157 門(mén)數(shù):250000 電源電壓:1.425 V ~ 1.575 V 安裝類(lèi)型:表面貼裝 工作溫度:-40°C ~ 125°C 封裝/外殼:256-LBGA 供應(yīng)商設(shè)備封裝:256-FPBGA(17x17)
A40MX02-1PQG100M 制造商:Microsemi Corporation 功能描述:FPGA 3K GATES 295 CELLS 96MHZ/160MHZ 0.45UM 3.3V/5V 100PQFP - Trays 制造商:Microsemi Corporation 功能描述:IC FPGA 57 I/O 100PQFP
A40MX02-1VQ80 功能描述:IC FPGA MX SGL CHIP 3K 80-VQFP RoHS:否 類(lèi)別:集成電路 (IC) >> 嵌入式 - FPGA(現(xiàn)場(chǎng)可編程門(mén)陣列) 系列:MX 標(biāo)準(zhǔn)包裝:90 系列:ProASIC3 LAB/CLB數(shù):- 邏輯元件/單元數(shù):- RAM 位總計(jì):36864 輸入/輸出數(shù):157 門(mén)數(shù):250000 電源電壓:1.425 V ~ 1.575 V 安裝類(lèi)型:表面貼裝 工作溫度:-40°C ~ 125°C 封裝/外殼:256-LBGA 供應(yīng)商設(shè)備封裝:256-FPBGA(17x17)
A40MX02-1VQ80I 功能描述:IC FPGA MX SGL CHIP 3K 80-VQFP RoHS:否 類(lèi)別:集成電路 (IC) >> 嵌入式 - FPGA(現(xiàn)場(chǎng)可編程門(mén)陣列) 系列:MX 標(biāo)準(zhǔn)包裝:90 系列:ProASIC3 LAB/CLB數(shù):- 邏輯元件/單元數(shù):- RAM 位總計(jì):36864 輸入/輸出數(shù):157 門(mén)數(shù):250000 電源電壓:1.425 V ~ 1.575 V 安裝類(lèi)型:表面貼裝 工作溫度:-40°C ~ 125°C 封裝/外殼:256-LBGA 供應(yīng)商設(shè)備封裝:256-FPBGA(17x17)
A40MX02-1VQ80M 制造商:Microsemi Corporation 功能描述:FPGA 3K GATES 295 CELLS 96MHZ/160MHZ 0.45UM 3.3V/5V 80VQFP - Trays 制造商:Microsemi Corporation 功能描述:IC FPGA 57 I/O 80VQFP