參數(shù)資料
型號(hào): 935267050025
廠商: NXP SEMICONDUCTORS
元件分類: 消費(fèi)家電
英文描述: SPECIALTY CONSUMER CIRCUIT, UUC
封裝: WAFER
文件頁(yè)數(shù): 10/23頁(yè)
文件大?。?/td> 331K
代理商: 935267050025
January 2005
Page 18 of 23
Public
15 Inlet/Label Characterisation and Test
15.1 Characterisation of the Inlet/Label
The parameters recommended to be characterised for the inlet/label are:
Parameter
Symbol
Conditions
Threshold field strength for
UNSELECTED READ command
(standard mode)
HTRead
UNSELECTED READ command OK
Threshold resonance frequency
fRT
Resonance frequency @ HTRead
No command transmitted to the inlet/label
à
Label generates no response
à No modulation
Threshold field strength for WRITE
command
(standard mode)
HTWrite
WRITE (and Verifying READ) command OK
For more detailed information on inlet /label characterisation please refer to Philips application note
‘ICODE Label IC, Coil Design Guide’.
15.2 Final Test of the Inlet/Label
Basic flow for production and test:
1. Production of wafer
2. Testing of dies on wafer
3. Writing of serial numbers and pre-configuration
4. Sawing of wafer
5. Assembly of inlets/labels
6. Final test of inlets/labels
7. Writing of customer data
To detect damage of EEPROM cells during production of inlets/labels a final test of the
EEPROM after assembly of the inlet/label is recommended. This is necessary to achieve
lowest failure rates.
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