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參數(shù)資料
| 型號： | 933964690623 |
| 廠商： | NXP SEMICONDUCTORS |
| 元件分類： | 計數(shù)移位寄存器 |
| 英文描述： | F/FAST SERIES, 8-BIT RIGHT SERIAL IN PARALLEL OUT SHIFT REGISTER, TRUE OUTPUT, PDSO16 |
| 封裝： | 3.90 MM, PLASTIC, MS-012AC, SOT-109-1, SO-16 |
| 文件頁數(shù)： | 10/13頁 |
| 文件大?。?/td> | 109K |
| 代理商： | 933964690623 |
Philips Semiconductors
Product specification
74F595
8-bit shift register with output latches (3-State)
1990 Apr 18
6
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
NO TAG
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONSNO TAG
MIN
TYP
NO TAG
MAX
UNIT
Qs
IO = 1mA
±10%VCC
2.5
V
VO
High level output voltage
Qs
VCC = MIN,
VIL = MAX
IOH=–1mA
±5%VCC
2.7
3.4
V
VOH
High-level output voltage
Q0 Q7
VIL = MAX,
VIH=MIN
IO = 3mA
±10%VCC
2.4
V
Q0–Q7
IOH =–3mA
±5%VCC
2.7
3.3
V
Qs
IO = 20mA
±10%VCC
0.30
0.50
V
VO
Low level output voltage
Qs
VCC = MIN,
VIL = MAX
IOL = 20mA
±5%VCC
0.30
0.50
V
VOL
Low-level output voltage
Q0 Q7
VIL = MAX,
VIH = MIN,
IO = 24mA
±10%VCC
0.35
0.50
V
Q0–Q7
IOL = 24mA
±5%VCC
0.35
0.50
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
–1.2
V
II
Input current at maximum input voltage
VCC = MAX, VI = 7.0V
100
A
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
A
IIL
Low-level input current
VCC = MAX, VI = 0.5V
–20
mA
IOZH
Off-state output current,
High level of voltage applied
Q0–Q7
only
VCC = MAX, VO = 2.7V
50
A
IOZL
Off-state output current,
Low level of voltage applied
Q0–Q7
only
VCC = MAX, VO = 0.5V
–50
A
IOS
Short-circuit output currentNO TAG
VCC = MAX
–60
–150
mA
ICCH
55
80
mA
ICC
Supply current (total)
ICCL
VCC = MAX
70
100
mA
ICCZ
65
95
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
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