參數資料
型號： 74F777
廠商： NXP Semiconductors N.V.
英文描述： Triple bidirectional latched bus transceiver (3-State + open collector)(三通道雙向鎖存總線收發(fā)器（三態(tài)+集電極開路）)
中文描述： 三鎖存總線雙向收發(fā)器（3態(tài)集電極開路）（三通道雙向鎖存總線收發(fā)器（三態(tài)集電極開路））
文件頁數： 6/12頁
文件大?。?/td> 98K
代理商： 74F777
Philips Semiconductors
Product specification
74F777
Triple bidirectional latched bus transceiver (3–State +
Open Collector)
May 19, 1992
6
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
LIMITS
TYP
2
UNIT
CONDITIONS
1
MIN
MAX
100
100
V
CC
I
OH
I
OFF
High–level output current
Power–off output current
B0
– B2
B0
– B2
V
CC
= MAX, V
IL
= MAX, V
IH
= MIN, V
OH
= 2.1V
V
CC
= 0.0V, V
IL
= MAX, V
IH
= MIN, V
OH
= 2.1V
V
CC
= MIN,
V
IL
= MAX,
V
IH
= MIN
V
CC
= MIN,
V
IL
= MAX,
V
IH
= MIN
V
CC
= MIN, I
I
= I
IK
V
CC
= MIN, I
I
= I
IK
μ
A
μ
A
V
I
OH
= –3mA, V
X
=V
CC
I
OH
= –4mA, V
X
= 3.13V
and 3.47V
I
OL
= 20mA, V
X
= V
cc
I
OL
= 100mA
I
OL
= 4mA
2.5
V
OH
High-level output voltage
A0
– A2
4
2.5
V
X
V
A0
– A2
4
B0
– B2
0.50
1.15
V
V
V
V
V
V
OL
Low-level output voltage
0.40
V
IK
Input clamp voltage
A0
– A2
Except A0
– A2
OEBn, OEAn,
LEn
A0
– A2,
B0
– B2
OEBn, OEAn,
LEn
B0
– B2
OEBn, OEAn
,
LEn
B0
– B2
-0.5
-1.2
I
I
Input current at
maximum input voltage
V
CC
= MAX, V
I
= 7.0V
100
μ
A
V
CC
= MAX, V
I
= 5.5V
1
mA
I
IH
High–level input current
V
CC
= MAX, V
I
= 2.7V, Bn – An = 0V
20
100
μ
A
μ
A
V
CC
= MAX, V
I
= 2.1V
I
IL
Low–level input current
V
CC
= MAX, V
I
= 0.5V
–20
–100
μ
A
μ
A
V
CC
= MAX, V
I
= 0.3V
I
OZH
+ I
IH
Off–state output current,
High level voltage applied
Off–state output current,
Low level voltage applied
A0
– A2
V
CC
= MAX, V
O
= 2.7V
70
μ
A
I
OZL
+ I
IL
A0
– A2
V
CC
= MAX, V
I
= 0.5V
–70
μ
A
I
X
High level control current
V
= MAX, V
= V
, LE = OEAn
= OEBn
= 2.7V,
A0 – A2 = 2.7V, B0 – B2 = 2.0V,
V
CC
= MAX, V
X
= 3.13 & 3.47V, LE = OEAn
=
2.7V, OEBn
= A0 – A2 = 2.7V, B0 – B2 = 2.0V
V
= MAX, Bn = 1.8V, OEAn = 2.0V,
OEBn
= 2.7V
V
CC
= MAX
V
CC
= MAX, V
IL
= 0.5V
V
CC
= MAX, V
IL
= 0.5V
–100
100
μ
A
–10
10
μ
A
I
OS
Short circuit output
current
3
A0
– A2
only
-60
-150
mA
I
CCH
I
CCL
I
CCZ
40
55
45
60
80
67
mA
mA
mA
I
CC
Supply current (total)
Notes to DC electrical characteristics
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
Unless otherwise specified, V
X
=V
CC
for all test condition.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
4. Due to test equipment limitations, actual test conditions are for V
IH
=1.8v and V
IL
= 1.3V.
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