參數(shù)資料
型號(hào): 74F723A
廠商: NXP Semiconductors N.V.
英文描述: CONN DSUB PLUG 15POS VERT PCB
中文描述: 四2選1數(shù)據(jù)選擇器多路三態(tài)
文件頁數(shù): 7/14頁
文件大?。?/td> 104K
代理商: 74F723A
Philips Semiconductors
Product specification
74F723A/74F723–1/
74F725A/74F725–1
Multiplexers
1990 Dec 13
7
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
LIMITS
TYP
NO TAG
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS
NO TAG
MIN
MAX
= 3mA
I
OH
= –3mA
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
2.4
V
V
OH
High level output voltage
High-level output voltage
V
CC
= MIN,
V
IL
= MAX
V
= MIN
IH
2.7
3.4
V
= 15mA
I
OH
= –15mA
2.0
V
2.0
V
74F723-1/
74F723 1/
74F725-1
I
OL
= 5mA
0.38
0.50
V
V
OL
Low level output voltage
Low-level output voltage
V
CC
= MIN,
V
IL
= MAX
V
= MIN
IH
0.38
0.50
V
74F723A/
74F725A
I
OL
= MAX
0.38
0.55
V
0.42
0.55
V
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
–0.73
–1.2
V
I
I
Input current at maximum input
voltage
V
CC
= MAX, V
I
= 7.0V
100
μ
A
I
IH
High-level input current
V
CC
= MAX, V
I
= 2.7V
20
μ
A
I
IL
Low level input current
Low-level input current
Others
V
CC
= MAX V = 0 5V
I
= 0.5V
–20
μ
A
μ
A
Dn only
–40
I
OZH
Off-state output current
High-level voltage
applied
74F723A/
74F723 1
74F723-1
only
V
CC
= MAX, V
O
= 2.7V
50
μ
A
I
OZL
Off-state output current
Low-level voltage
applied
V
CC
= MAX, V
O
= 0.5V
–50
μ
A
I
OS
Short-circuit output
current
3
74F723-1/
74F725-1
V
CC
= MAX
–60
–150
mA
I
O
Output current
NO TAG
74F723A/
74F725A
V
CC
= MAX, V
O
= 2.25V
–60
–150
mA
I
CCH
I
CCL
I
CCZ
I
CCH
I
CCL
I
CCZ
I
CCH
I
CCL
I
CCH
I
CCL
23
30
mA
74F723A
V
CC
= MAX
29
40
mA
25
40
mA
23
35
mA
I
CC
Supply
current
(total)
74F723-1
V
CC
= MAX
29
40
mA
26
40
mA
74F725A
V
CC
= MAX
16
25
mA
24
35
mA
74F725 1
74F725-1
V
CC
= MAX
17
25
mA
25
35
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
tests should be performed last.
4. I
O
is tested under conditions that produce current approximity one half of the true short-circuit output current (I
OS
).
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