參數(shù)資料
型號: 74F657
廠商: NXP Semiconductors N.V.
英文描述: Octal transceiver with 8-bit parity generator/checker(帶8位奇偶發(fā)生器/校驗器的八收發(fā)器)
中文描述: 八路收發(fā)器帶有8位奇偶發(fā)生器/檢查(帶8位奇偶發(fā)生器/校驗器的八收發(fā)器)
文件頁數(shù): 6/12頁
文件大?。?/td> 109K
代理商: 74F657
Philips Semiconductors
Product specification
74F657
Octal transceiver with 8-bit parity generator/checker
90 July 30
6
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
LIMITS
TYP
2
UNIT
CONDITIONS
1
I
OH
= –3mA
4,5
MIN
MAX
All outputs
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
±
5%V
CC
2.4
V
V
CC
= MIN,
V
IL
= MAX,
V
IH
= MIN
2.7
V
V
OH
High-level output voltage
B0 – B7,
I
OH
= –12mA
5
2.0
V
PARITY,
2.0
V
ERROR
I
OH
= –15mA
4
2.0
V
2.0
V
A0 – A7
I
OL
= 24mA
4,5
0.35
0.50
V
V
CC
= MIN,
V
IL
= MAX,
V
IH
= MIN
0.35
0.50
V
V
OL
Low-level output voltage
B0 – B7,
I
OL
= 48mA
4
I
OL
= 48mA
5
I
OL
= 64mA
4
0.38
0.55
V
PARITY,
0.42
0.55
V
ERROR
0.42
0.55
V
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
–0.73
-1.2
V
Input current at
maximum input voltage
OE, T/R,
ODD/EVEN
A0 – A7
B0 – B7
V
CC
= 0.0V, V
I
= 7.0V
100
μ
A
I
I
V
CC
= 5.5V, V
I
= 5.5V
2
1
mA
mA
μ
A
μ
A
μ
A
μ
A
μ
A
μ
A
OOD/EVEN
20
4
40
5
40
4
80
5
I
IH
High–level input current
V
CC
= MAX, V
I
= 2.7V
OE, T/R
I
IL
Low–level input current
OOD/EVEN
V
CC
= MAX, V
I
= 0.5V
–20
OE, T/R
–40
I
OZH
+ I
IH
Off–state output current,
high–level voltage applied
A0 – A7,
B0 – B7,
V
CC
= MAX, V
O
= 2.7V
70
μ
A
I
OZL
+ I
IL
Off–state output current,
low–level voltage applied
PARITY
V
CC
= MAX, V
O
= 0.5V
–70
μ
A
I
OZH
Off–state output current,
High–level voltage applied
ERROR
V
CC
= MAX, V
O
= 2.7V
50
μ
A
I
OZL
Off–state output current,
low–level voltage applied
V
CC
= MAX, V
O
= 0.5V
–50
μ
A
I
OS
Short circuit output current
3
A0 – A7
V
CC
= MAX
-60
-150
mA
B0 – B7
-100
-225
125
4
135
5
150
4
160
5
mA
I
CCH
90
mA
90
mA
I
CC
Supply current (total)
I
CCL
V
CC
= MAX
106
mA
106
mA
I
CCZ
98
145
mA
Notes to DC electrical characteristics
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
4. For commercial range.
5. For industrial range.
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