參數(shù)資料
型號(hào)： 74F604
廠商： NXP Semiconductors N.V.
英文描述： Dual octal latch 3-State
中文描述： 雙八進(jìn)制鎖存器三態(tài)
文件頁(yè)數(shù)： 5/7頁(yè)
文件大?。?/td> 53K
代理商： 74F604
Philips Semiconductors
Product specification
74F604
Dual octal latch (3-State)
1990 Mar 01
5
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
TYP
2
UNIT
MIN
MAX
V
OH
High-level output voltage
= MIN, V
= MAX,
V
CC
MIN, V
IL
MAX,
V
IH
= MIN, I
OH
= MAX
±
10%V
CC
2.4
V
±
5%V
CC
2.7
3.4
V
V
OL
Low-level output voltage
= MIN, V
= MAX,
V
CC
MIN, V
IL
MAX,
V
IH
= MIN, I
OL
= MAX
±
10%V
CC
0.35
0.50
V
±
5%V
CC
0.35
0.50
V
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
–0.73
–1.2
V
I
I
Input current at maximum input
voltage
V
CC
= 0.0V, V
I
= 7.0V
100
μ
A
I
IH
High-level input current
V
CC
= MAX, V
I
= 2.7V
20
μ
A
I
IL
Low-level input current
V
CC
= MAX, V
I
= 0.5V
–20
μ
A
I
OZH
Off state output current,
High-level voltage applied
V
CC
= MAX, V
O
= 2.7V
50
μ
A
I
OZL
Off state output current,
Low-level voltage applied
V
CC
= MAX, V
O
= 0.5V
–50
μ
A
I
OS
Short-circuit output current
3
V
CC
= MAX
–60
–150
mA
I
CC
Supply current (total)
I
CCH
= MAX
V
CC
An, Bn, SELECT A/B = 4.5V, LE =
↑
60
82
mA
I
CCL
An, Bn, SELECT A/B=GND, LE =
↑
75
100
mA
I
CCZ
An, Bn, SELECT A/B = GND,
LE = GND
75
100
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
SYMBOL
PARAMETER
TEST
LIMITS
UNIT
CONDITION
V
CC
= +5V
T
amb
= +25
°
C
C
L
= 50pF, R
L
= 500
V
CC
= +5V
±
10%
T
amb
= 0
°
C to +70
°
C
C
L
= 50pF, R
L
= 500
MIN
TYP
MAX
MIN
MAX
t
PLH
t
PHL
Propagation delay
SELECT A/B to Qn (B latch)
Waveform 1
5.0
6.0
7.0
8.5
9.0
10.5
4.5
5.5
10.0
11.5
ns
t
PLH
t
PHL
Propagation delay
SELECT A/B to Qn (A latch)
Waveform 2
6.0
4.0
8.0
6.5
10.0
8.5
5.5
3.5
11.5
9.0
ns
t
PZH
t
PZL
Output Enable time
to High or Low level
Waveform 4
Waveform 5
5.0
5.0
7.5
7.5
9.5
9.5
4.5
4.5
10.5
11.0
ns
t
PHZ
t
PLZ
Output Disable time
from High or Low level
Waveform 4
Waveform 5
5.0
5.0
7.0
7.0
9.5
9.5
4.5
4.5
11.0
11.0
ns
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