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參數(shù)資料
| 型號(hào)： | 74F322 |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | 8-bit serial/parallel register with sign extend 3-State |
| 中文描述： | 8位串行/并行登記注冊(cè)延長(zhǎng)三態(tài) |
| 文件頁(yè)數(shù)： | 5/9頁(yè) |
| 文件大?。?/td> | 80K |
| 代理商： | 74F322 |
Philips Semiconductors
Product specification
74F322
8-bit serial/parallel register with sign extend (3-State)
1988 Apr 22
5
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
TYP
2
UNIT
MIN
MAX
V
OH
High-level output voltage
Q7
V
IH
= MIN
I
OH
= –1mA
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
2.5
V
V
CC
= MIN,
V
IL
= MAX,
2.7
3.4
V
I/On
I
OH
= –3mA
2.4
V
2.7
3.3
V
V
OL
Low-level output voltage
V
CC
= MIN,
V
IH
= MIN
I
OL
= MAX
±
10%V
CC
0.38
0.55
V
V
IL
= MAX,
±
5%V
CC
0.35
0.50
V
V
IK
I
I
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
V
CC
= MAX, V
I
= 7.0V
V
CC
= MAX, V
I
= 5.5V
V
CC
= MAX, V
I
= 2.7V
–0.73
–1.2
V
maximum input voltage
others
100
μ
A
Input current at
I/On
1
mA
I
IH
High-level input current
20
μ
A
I
IL
Low-level input current
SE
V
–1.8
mA
S
–1.2
mA
others
CC
= MAX, V
I
= 0.5V
–0.6
mA
I
IH +
I
OZH
Off-state output current
High-level voltage applied
V
CC
= MAX, V
I
= 2.7V
70
μ
A
I
IL +
I
OZL
Off-state output current
Low-level voltage applied
Short-circuit output current
3
V
CC
= MAX, V
I
= 0.5V
–0.6
mA
I
OS
V
CC
= MAX
–60
–150
mA
I
CCH
I
CCL
I
CCZ
V
50
75
mA
I
CC
Supply current (total)
60
90
mA
CC
= MAX
65
95
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
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相關(guān)代理商/技術(shù)參數(shù) |
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|---|---|
| 74F322 WAF | 制造商:Fairchild Semiconductor Corporation 功能描述: |
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| 74F322PC | 功能描述:計(jì)數(shù)器移位寄存器 Octal Ser/Par Reg RoHS:否 制造商:Texas Instruments 計(jì)數(shù)器類(lèi)型: 計(jì)數(shù)順序:Serial to Serial/Parallel 電路數(shù)量:1 封裝 / 箱體:SOIC-20 Wide 邏輯系列: 邏輯類(lèi)型: 輸入線路數(shù)量:1 輸出類(lèi)型:Open Drain 傳播延遲時(shí)間:650 ns 最大工作溫度:+ 125 C 最小工作溫度:- 40 C 封裝:Reel |
| 74F322SJ | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:Octal Serial/Parallel Register with Sign Extend |
| 74F323 | 制造商:FAIRCHILD 制造商全稱:Fairchild Semiconductor 功能描述:Octal Universal Shift/Storage Register with Synchronous Reset and Common I/O Pins |
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