參數(shù)資料
型號: 2SK4070(1)-S27-AY
元件分類: 小信號晶體管
英文描述: 1000 mA, 600 V, N-CHANNEL, Si, SMALL SIGNAL, MOSFET, TO-251AA
封裝: LEAD FREE, MP-3-B, 3 PIN
文件頁數(shù): 5/10頁
文件大?。?/td> 266K
代理商: 2SK4070(1)-S27-AY
Data Sheet D18785EJ2V0DS
2
2SK4070
ELECTRICAL CHARACTERISTICS (TA = 25
°C)
CHARACTERISTICS
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
Zero Gate Voltage Drain Current
IDSS
VDS = 600 V, VGS = 0 V
100
μA
Gate Leakage Current
IGSS
VGS =
±30 V, VDS = 0 V
±100
nA
Gate Cut-off Voltage
VGS(off)
VDS = 10 V, ID = 1 mA
2.5
2.9
3.5
V
Forward Transfer Admittance
Note
| yfs |
VDS = 10 V, ID = 0.5 A
0.2
0.4
S
Drain to Source On-state Resistance
Note
RDS(on)
VGS = 10 V, ID = 0.5 A
9.2
11
Ω
Input Capacitance
Ciss
VDS = 10 V,
110
pF
Output Capacitance
Coss
VGS = 0 V,
50
pF
Reverse Transfer Capacitance
Crss
f = 1 MHz
11
pF
Turn-on Delay Time
td(on)
VDD = 150 V, ID = 0.5 A,
7.5
ns
Rise Time
tr
VGS = 10 V,
6
ns
Turn-off Delay Time
td(off)
RG = 10
Ω
11
ns
Fall Time
tf
18
ns
Total Gate Charge
QG
VDD = 450 V,
5
nC
Gate to Source Charge
QGS
VGS = 10 V,
1
nC
Gate to Drain Charge
QGD
ID = 1.0 A
2.8
nC
Body Diode Forward Voltage
Note
VF(S-D)
IF = 1.0 A, VGS = 0 V
0.86
1.5
V
Reverse Recovery Time
trr
IF = 1.0 A, VGS = 0 V,
135
ns
Reverse Recovery Charge
Qrr
di/dt = 100 A/
μs
285
nC
Note Pulsed
TEST CIRCUIT 1 AVALANCHE CAPABILITY
RG = 25
Ω
50
Ω
PG.
L
VDD
VGS = 20
→ 0 V
BVDSS
IAS
ID
VDS
Starting Tch
VDD
D.U.T.
TEST CIRCUIT 3 GATE CHARGE
TEST CIRCUIT 2 SWITCHING TIME
PG.
RG
0
VGS
D.U.T.
RL
VDD
τ = 1 s
μ
Duty Cycle
≤ 1%
τ
PG.
50
Ω
D.U.T.
RL
VDD
IG = 2 mA
VGS
Wave Form
VDS
Wave Form
VGS
VDS
10%
0
90%
VGS
VDS
ton
toff
td(on)
tr
td(off)
tf
10%
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